Efficient static compaction of test sequence sets through the application of set covering techniques

M Dimopoulos, P Linardis - … and Test in Europe Conference and …, 2004 - ieeexplore.ieee.org
The test sequence compaction problem is modelled here, as a set covering problem. This
formulation enables the straightforward application of set covering methods for compaction …

Fuzzy logic enhanced time Petri Net models for hybrid control systems

TS Letia, AO Kilyen - 2016 IEEE International Conference on …, 2016 - ieeexplore.ieee.org
A Hybrid Control System (HCS) model has to implement the reaction to discrete events that
occur in a controlled plant and as well as to control the continuous time parts according to …

Co-processor synthesis: a new methodology for embedded software acceleration

B Hounsell, R Taylor - … Design, Automation and Test in Europe …, 2004 - ieeexplore.ieee.org
This paper introduces co-processor synthesis-a methodology that provides design benefits
by implementing hardware co-processors directly from embedded software. The paper …

Accelerating the compaction of test sequences in sequential circuits through problem size reduction

M Dimopoulos, P Linardis - IEEE Transactions on Computer …, 2003 - ieeexplore.ieee.org
The problem of compacting a set of test sequences for sequential circuits is modeled here
with the help of a covering matrix, where the test sequences are modeled as columns with …

[PDF][PDF] Improved Selection of Test SubSequences in Sequential Circuits for Reduced Power Consumption

M Dimopoulos, P Linardis - Proc IMACS/IEEE-The 7th Int …, 2003 - researchgate.net
A method for the reduction of power dissipation during testing of sequential circuits is
presented. In this algorithm from an initial set of test sequences a set of subsequences is …

[PDF][PDF] Accelerated Static Compaction for Sequential Circuits by Exploiting" Essential" Subsequences

M DIMOPOULOS, P LINARDIS - Citeseer
In this paper a GA-based method that compacts Test Sequences for sequential circuits is
presented. In this algorithm from an initial set of test sequences a subset of sequences is …

[PDF][PDF] Test Set Minimization for Sequential VLSI Circuits Under Power or Time Constraints

M Dimopoulos, P Linardis - WSEAS Transactions on Circuits and …, 2005 - researchgate.net
This paper deals with two problems arising during the testing of sequential VLSI circuits,
namely the test sequence compaction problem and the power minimization problem. Here is …

[PDF][PDF] Search space pruning techniques in ATPG for VLSI circuits

M Dimopoulos, P Linardis - … of the 9th International Conference on …, 2005 - researchgate.net
This paper presents a, common, unified approach to solve either the test sequence
compaction problem or the power minimization problem during circuit testing. This approach …

[PDF][PDF] Reducing power consumption during testing of VLSI circuits by proper subsequence selection and modification.

M Dimopoulos, P Linardis - WSEAS Transactions on Circuits and Systems, 2004 - Citeseer
A method for minimizing power dissipation in CMOS sequential circuits during test
application is presented. Initially, the set of test sequences with the transition counts …