One-bit sine-fit

P Carbone, J Schoukens, A De Angelis… - IEEE Transactions …, 2021 - ieeexplore.ieee.org
This article introduces a novel procedure for the estimation of the frequency, amplitude, and
phase of a sinusoidal signal after one-bit quantization. The estimator requires knowledge of …

Dithering loopback-based prediction technique for mixed-signal embedded system specifications

B Kim - IEEE Transactions on Circuits and Systems II: Express …, 2015 - ieeexplore.ieee.org
Lower cost test solutions are required to overcome high test cost issue of conventional
characterization for the mixed-signal circuits, which is primarily caused by test equipment …

Designing nonlinearity characterization for mixed-signal circuits in system-on-chip

B Kim, JA Abraham - Analog Integrated Circuits and Signal Processing, 2015 - Springer
Long test times and the use of conventional automatic test equipment (ATE) makes
conventional mixed-signal linearity performance testing costly. Diminishing test time of …

Bitstream-driven built-in characterization for analog and mixed-signal embedded circuits

B Kim, JA Abraham - … Transactions on Circuits and Systems II …, 2014 - ieeexplore.ieee.org
The conventional analog and mixed-signal production testing of system-on-a-chip systems
provides limited controllability and observability because automatic test equipment (ATE) …

Frequency and amplitude domain DAC-ADC co-testing using ternary signals

P Carbone, J Schoukens, A De Angelis… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
The parametric estimation of devices in a signal chain, including the cascade of a digital-to-
analog converter (DAC), a low-pass filter, and an analog-to-digital converter (ADC), is …

Capacitor-coupled built-off self-test in analog and mixed-signal embedded systems

B Kim, JA Abraham - … Transactions on Circuits and Systems II …, 2013 - ieeexplore.ieee.org
Design-for-test (DfT) circuitry that employs differential terminals inherently suffers from an
imbalance in the output of its differential pair. By providing the imbalanced differential test …

Dynamic performance characterization of embedded single-ended mixed-signal circuits

B Kim, JA Abraham - … Transactions on Circuits and Systems II …, 2014 - ieeexplore.ieee.org
The inherent fault-masking characteristic of the traditional loopback test produces overly
pessimistic estimates of device-under-test (DUT) performance, which negatively impacts …

Research on Multi-domain Mixed Analysis Technology of Communication Signals

H Zeng, L Guo, J Gao - Proceedings of the 6th International Conference …, 2018 - dl.acm.org
Aiming at the test requirements for broadband signals, transient signals and HDR (High
Dynamic Range) signals under complex electromagnetic environment, the multi-domain …

Efficient Signature-Driven Self-Test for Differential Mixed-Signal Circuits

B Kim - JSTS: Journal of Semiconductor Technology and …, 2016 - koreascience.kr
Predicting precise specifications of differential mixed-signal circuits is a difficult problem,
because analytically derived correlation between process variations and conventional …