The generation and propagation of single event transients (SET) is measured and modeled
in SOI inverter chains with different designs. SET propagation in inverter chains induces …

There is an invisible enemy that constantly threatens the operation of electronics: ionizing
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …

The propagation of single event transients (SET) is measured and modeled in SOI and bulk
inverter chains. The propagation-induced pulse broadening (PIPB) effect is shown to …

As today's process technologies continuously scale down, circuits become increasingly
more vulnerable to radiation-induced soft errors in nanoscale VLSI technologies. The …

Previous results and models have predicted that combinational logic errors would dominate
over flip-flop errors for the past few technology nodes. However, recent experimental results …

SEUs due to combinational logic in 90 nm CMOS is analyzed at various speeds using a new
design approach called the combinational circuit for radiation effects self-test (C-CREST). C …

Classic distributed computing abstractions do not match well the reality of digital logic gates,
which are the elementary building blocks of Systems-on-Chip (SoCs) and other Very Large …

We present the first implementation of a distributed clock generation scheme for Systems-on-
Chip that recovers from an unbounded number of arbitrary transient faults despite a large …

Mean and partial cross-section concepts and their connections to multiplicity and statistics of
multiple cell upsets (MCUs) in highly-scaled digital memories are introduced and discussed …

Chip-level soft-error rate (SER) estimation can come from two sources: direct experimental
measurement and simulation. Because SER mitigation decisions need to be made very …