As the feature size of integrated circuits (ICs) continues to shrink, radiation-induced multiple
bit upsets (MBUs) become more frequent than single bit upsets (SBUs) in nanometer ICs …

With shrinking structure sizes, soft-error mitigation has become a major challenge in the
design and certification of safety-critical embedded systems. Their robustness is quantified …

In application specific integrated circuits used in aircraft control systems the effects of
transient fault, both in temporal and spatial domain emanating from a single particle strike …

Abstract ASICs for Stochastic Computing conditions are designed for higher energy-
efficiency or performance by sacrificing computational accuracy due to intentional circuit …

The purpose of this research topic is to investigate the properties of reconfigurable devices
(ie, FPGA) under a radiation environment to finally propose a new methodology to design …

As the feature size of integrated circuit (IC) continues to shrink, the soft failure probability
induced by single event upset and single event transient (SEU/SET) for ICs exposing to …

Networks-On-Chip (NoCs) have emerged as a promising solution to replace global on-chip
interconnections in System-On-Chip (SoC) thanks to better performance and lower power …

The power consumption of digital hearing aids is very restricted due to their small physical
size and the available hardware resources for signal processing are limited. However, there …

Networks-on-Chip (NoC) have emerged as a viable solution for the communication
challenges in highly complex Systems-on-Chip (SoC). The NoC architecture paradigm …

Shrinking hardware structures and decreasing operating voltages lead to an increasing
number of transient hardware faults, which thus become a core problem to consider for …