Efficient generation of stimuli for functional verification by backjumping across extended FSMs

GD Guglielmo, LD Guglielmo, F Fummi… - Journal of Electronic …, 2011 - Springer
Extended finite state machines (EFSMs) can be efficiently adopted to model the functionality
of complex designs without incurring the state explosion problem typical of the more …

A scalable method for solving satisfiability of integer linear arithmetic logic

HM Sheini, KA Sakallah - Theory and Applications of Satisfiability Testing …, 2005 - Springer
In this paper, we present a hybrid method for deciding problems involving integer and
Boolean variables which is based on generic SAT solving techniques augmented with a) a …

Improving gate-level ATPG by traversing concurrent EFSMs

G Di Guglielmo, F Fummi, C Marconcini… - 24th IEEE VLSI Test …, 2006 - ieeexplore.ieee.org
The paper describes a high-level pseudodeterministic ATPG that explores the DUT state
space by exploiting an easy-to-traverse extended FSM model. Testing of hard-to-detect …

FATE: a functional ATPG to traverse unstabilized EFSMs

G Di Guglielmo, F Fummi, C Marconcini… - … IEEE European Test …, 2006 - ieeexplore.ieee.org
The paper describes a functional ATPG that explores the DUT state space by exploiting an
easy-to-traverse extended FSM model. The ATPG engine relies on learning, backjumping …

A progressive simplifier for satisfiability modulo theories

HM Sheini, KA Sakallah - … Conference on Theory and Applications of …, 2006 - Springer
In this paper we present a new progressive cooperating simplifier for deciding the
satisfiability of a quantifier-free formula in the first-order theory of integers involving …

Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM

G Di Guglielmo, F Fummi, C Marconcini… - IET Computers & Digital …, 2007 - IET
A functional automatic test pattern generator (ATPG) that explores the design under test
(DUT) state space by exploiting an easy-to-traverse extended finite state machine (FSM) …

On the validation of embedded systems through functional ATPG

G Di Guglielmo - 2008 Ph. D. Research in Microelectronics and …, 2008 - ieeexplore.ieee.org
Increasing size and complexity of digital designs has made essential to address critical
verification issues at the early stages of design cycle. Therefore, automated verification tools …

RTSAT: A Hybrid Satisfiability Solver for RTL Circuits

S Deng, W Wu, J Bian - 2006 International Conference on …, 2006 - ieeexplore.ieee.org
This paper presents an efficient strategy to solve the satisfiability (SAT) problem for RTL
designs. Boolean DPLL algorithm is extended into a unified procedure to solve the hybrid …

Constraint propagation in physical design of circuits

T Nie, J Gao, L Zhou - IET Circuits, Devices & Systems, 2020 - Wiley Online Library
Physical design is a crucial stage determining the ultimate performance of very‐large‐scale
integration design in which the constraint application plays an important role. Unfortunately …

Test Generation based on CLP

G Di Guglielmo, F Fummi, C Marconcini… - Micro Electronic and …, 2009 - books.google.com
The complexity of designs continues to rise, driven by technology advances, while time-
tomarket imposes always shorter time. Moreover, the increasing of design complexity …