[PDF][PDF] Functional testing of semiconductor random access memories
MS Abadir, HK Reghbati - ACM Computing Surveys (CSUR), 1983 - dl.acm.org
This paper presents an overview of the problem of testing semiconductor random access
memories (RAMs). An important aspect of this test procedure is the detection of permanent …
memories (RAMs). An important aspect of this test procedure is the detection of permanent …
Counterfeit integrated circuits: Detection, avoidance, and the challenges ahead
The counterfeiting of electronic components has become a major challenge in the 21st
century. The electronic component supply chain has been greatly affected by widespread …
century. The electronic component supply chain has been greatly affected by widespread …
An overview of deterministic functional RAM chip testing
AJ van de Goor, CA Verruijt - ACM Computing Surveys (CSUR), 1990 - dl.acm.org
This paper presents an overview of deterministic functional RAM chip testing. Instead of the
traditional ad-hoc approach toward developing memory test algorithms, a hierarchy of …
traditional ad-hoc approach toward developing memory test algorithms, a hierarchy of …
Using march tests to test SRAMs
AJ Van De Goor - IEEE Design & Test of Computers, 1993 - ieeexplore.ieee.org
A unified notation is presented for static random access memory (SRAM) fault models and
fault tests for these models. The likelihood that the different types of faults will occur is …
fault tests for these models. The likelihood that the different types of faults will occur is …
A realistic fault model and test algorithms for static random access memories
R Dekker, F Beenker, L Thijssen - IEEE Transactions on …, 1990 - ieeexplore.ieee.org
Testing static random access memories (SRAMs) for all possible failures is not feasible and
one must restrict the class of faults to be considered. This restricted class is called a fault …
one must restrict the class of faults to be considered. This restricted class is called a fault …
March SS: A test for all static simple RAM faults
S Hamdioui, AJ Van de Goor… - Proceedings of the 2002 …, 2002 - ieeexplore.ieee.org
This paper presents all simple (ie, not linked) static fault models that have been shown to
exist for random access memories (RAMs), and shows that none of the current industrial …
exist for random access memories (RAMs), and shows that none of the current industrial …
Testing static and dynamic faults in random access memories
S Hamdioui, Z Al-Ars… - Proceedings 20th IEEE …, 2002 - ieeexplore.ieee.org
The ever increasing trend to reduce DPM levels of memories requires tests with very high
fault coverage. The important class of dynamic faults, therefore, cannot be ignored any more …
fault coverage. The important class of dynamic faults, therefore, cannot be ignored any more …
A comprehensive framework for counterfeit defect coverage analysis and detection assessment
The increasing threat of counterfeit electronic components has created specialized service
of testing, detection, and avoidance of such components. However, various types of …
of testing, detection, and avoidance of such components. However, various types of …
An experimental analysis of spot defects in SRAMs: realistic fault models and tests
S Hamdioui, AJ Van De Goor - Proceedings of the Ninth Asian …, 2000 - ieeexplore.ieee.org
In this paper a complete analysis of spot defects in industrial SRAMs will be presented. All
possible defects are simulated, and the resulting electrical faults are transformed into …
possible defects are simulated, and the resulting electrical faults are transformed into …
Fault modeling and test algorithm development for static random access memories
R Dekker, F Beenker, L Thijssen - … Test Conference 1988 …, 1988 - ieeexplore.ieee.org
A fault model for SRAMs (static random-access memories) is presented based on physical
spot defects, which are modeled as local disturbances in the layout of an SRAM. Two linear …
spot defects, which are modeled as local disturbances in the layout of an SRAM. Two linear …