[HTML][HTML] Microstructure evolution at the interface between Cu and eutectic Sn–Bi alloy with the addition of Ag or Ni

O Minho, Y Tanaka, E Kobayashi - Journal of Materials Research and …, 2023 - Elsevier
The study investigated the growth kinetics and rate-controlling processes of intermetallic
layers formed at the interface between Cu and eutectic Sn–Bi alloys with Ag or Ni addition at …

Growth behavior of intermetallic layers at the interface between Cu and eutectic Sn–Bi by grain boundary diffusion with the grain growth at solid-state temperatures

O Minho, Y Tanaka, E Kobayashi - Intermetallics, 2023 - Elsevier
The growth kinetics and rate-controlling processes of intermetallic layers formed in Cu/(Sn-
58 wt% Bi) diffusion couples were investigated. Isothermal annealing of diffusion couples …

Investigation of the rate-controlling process of intermetallic layer growth at the interface between ferrous metal and molten Al–Mg–Si alloy

O Minho, K Sato, E Kobayashi - Intermetallics, 2023 - Elsevier
In this study, we focused on unraveling the intricate world of intermetallic compound
formation at the interface of solid Fe and liquid Al–Mg–Si alloy. Our primary aim was to shed …

[HTML][HTML] Influence of carbon nanotubes on the morphology of Cu6Sn5 in Cu/(Sn–Ag–Cu) solder joints

M Oh, H Iwamoto, E Kobayashi - Results in Materials, 2024 - Elsevier
This study delves into the intricate interaction between multi-walled carbon nanotubes
(MWCNTs) and the Sn–Ag–Cu solder system, highlighting its relevance in lead-free …

Microstructural transformations in solid-state annealed Al/Ag/Al diffusion couples examined via high-voltage electron microscopy (HVEM)

M Oh, M Kajihara - Metals, 2023 - mdpi.com
This study focuses on the practical relevance of the Al-Ag bonding interface in electronic
device fabrication, particularly in wire bonding, which is crucial for enhancing component …

Effect of CNTs on the intermetallic compound growth between Sn solder and Cu substrate during aging and reflowing

K Xu, L Zhang, N Jiang - Journal of Materials Science: Materials in …, 2021 - Springer
Sn is the main interconnect material for three-dimensional (3D) Packaging of chip stacking
in electronic packaging. In this paper, the intermetallic compound (IMC) produced through …

Kinetics and thermodynamics of compound growth due to reactive diffusion between solid Cu and binary Bi-Sn alloys

O Minho, H Fujita, E Kobayashi, M Kajihara - Journal of Molecular Liquids, 2022 - Elsevier
The growth behavior of compounds for the reactive diffusion between solid Cu and molten
binary Bi-Sn alloys was experimentally examined using semi-infinite diffusion couples …

[HTML][HTML] The growth kinetics of intermetallic compounds by the fast diffusion path at the interface of Co and molten Zn

M Oh, K Matsushita, E Kobayashi, M Kajihara - Journal of Molecular Liquids, 2024 - Elsevier
This study investigates the growth and microstructure formation of intermetallic compounds
at the solid/liquid interface of a Co/Zn diffusion couple prepared using an isothermal …

Effect of P content on diffusion resistance and interfacial mechanical properties of crystalline Co–P coatings in solder joints

C Zhen, L Ma, S Liu, Y Wang, D Li, F Guo - Journal of Materials Science …, 2023 - Springer
Electroplating crystalline cobalt–phosphorus (Co–P, with 1~ 8 at.% P) is a potential
interfacial layer for electronic packaging solder joints, however, the optimal content of P has …

Transient Liquid Phase Bonding with Sn-Ag-Co Composite Solder for High-Temperature Applications

B Kim, G Cheon, YH Ko, Y Sohn - Electronics, 2024 - mdpi.com
In this study, a novel composite solder, Sn-3.5 Ag-10.0 Co, was tailored for transient liquid
phase (TLP) bonding in electric vehicle power module integration. Employing a meticulous …