This paper presents a micromachined probe for on-wafer measurements of circuits in the WR-1.0 waveguide band (0.75-1.1 THz). The probe shows a measured insertion loss of less …
L Chen, C Zhang, TJ Reck, A Arsenovic… - IEEE Transactions …, 2012 - ieeexplore.ieee.org
An improved micromachined on-wafer probe covering frequencies 500-750 GHz is demonstrated in this paper to address sub-millimeter-wave integrated-circuit testing …
NS Barker, M Bauwens, R Weikle - Proceedings of the IEEE, 2016 - ieeexplore.ieee.org
This paper presents a comprehensive overview of the development and utilization of a micromachined silicon-on-insulator (SOI) fabrication process that has enabled the …
A Malko, T Bryllert, J Vukusic… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
We present a silicon integrated Heterostructure Barrier Varactor (HBV) frequency quintupler (× 5) operating between 440 GHz and 490 GHz. By epitaxial transfer of InP-based HBV …
T Globus, AM Moyer, B Gelmont… - IEEE Sensors …, 2012 - ieeexplore.ieee.org
Sub-terahertz (sub-THz) vibrational spectroscopy for biosensing is based on specific resonance features, vibrational modes or group of modes at close frequencies, in the …
Q Yu, MF Bauwens, C Zhang… - IEEE transactions on …, 2013 - ieeexplore.ieee.org
This paper introduces an improved method for monitoring and controlling the contact condition of terahertz on-wafer probes to enhance the measurement repeatability as well as …
A micromachined on-wafer probe is designed, fabricated and measured at W-Band as a proof of concept for probes operating at sub-millimeter wavelengths. A fabrication process is …
L Chen, C Zhang, TJ Reck, C Groppil… - 2011 IEEE MTT-S …, 2011 - ieeexplore.ieee.org
Although progress has been made in the development of submillimeter-wave monolithic integrated circuits, the evaluation of these circuits still relies on test fixtures, which makes …
J Marzouk, S Arscott, A El Fellahi… - Journal of …, 2015 - iopscience.iop.org
This article presents microelectromechanical system (MEMS) ground-signal-ground (GSG) probes based on silicon-on-insulator (SOI) technology for on-wafer microwave …