This work introduces a multi-stage CMOS OTA design technique that allows cascading
identical gain stages (for arbitrarily scalable high DC gain) while driving an ultra-wide range …

This paper presents an in-depth analysis of the Slew-Rate (SR) in scalable multi-stage
CMOS Operational Transconductance Amplifiers (OTAs). These OTAs utilize Low …

Offline and online built-in self-test (BIST) designs are low-cost platforms to test very complex
modern chips. The offline BIST design embeds the test pattern generator (TPG) into the chip …

Built in self-test (BIS T) modules are essential devices in various application, which includes
microprocessors, microcontroller, multi-core system, and multi-processor systems. The …

Linearity testing of an analog-to-digital converter (ADC) with automatic test equipment is
expensive and challenging. In this paper, an improved method is proposed for high …

Achieving coherent sampling has always been a major challenge in analog-to-digital
converter (ADC) spectral testing. If the coherent sampling condition cannot be met, leakage …

This paper proposes a random shifting data weighted averaging (RSDWA) algorithm where
a bidirectional circular shift register is coworked with a pseudo-random sequencer to form a …

This paper studies the problem of finding a high coverage minimum test set for a 6-bit R-2R
ladder Digital-to-Analog Converter (DAC). DAC is a versatile component that is used in …

Today, testing of AMS circuits needs to improve quality towards ppb test escape levels as
well as decrease the test development time to reduce the IC lead time. A defect-oriented …

Built in self-test (BIST) modules are essential devices in various application, which includes
microprocessors, microcontroller, multi-core system, and multi-processor systems. The …