Defect identification in semiconductors with positron annihilation:<? format?> Experiment and theory

F Tuomisto, I Makkonen - Reviews of Modern Physics, 2013 - APS
Positron annihilation spectroscopy is particularly suitable for studying vacancy-type
defects<? format?> in semiconductors. Combining state-of-the-art experimental and …

Determination of the Gibbs free energy of formation of Ga vacancies in GaAs by positron annihilation

J Gebauer, M Lausmann, F Redmann… - Physical Review B, 2003 - APS
We determined the Gibbs free energy of formation—ie, the formation enthalpy and entropy—
as well as the charge state of Ga vacancies in n-type GaAs by directly probing the vacancy …

Defect identification in GaAs grown at low temperatures by positron annihilation

J Gebauer, F Börner, R Krause-Rehberg… - Journal of Applied …, 2000 - pubs.aip.org
We use positron annihilation to study vacancy defects in GaAs grown at low temperatures
(LT–GaAs). The vacancies in as-grown LT–GaAs can be identified to be Ga monovacancies …

First-principles calculation of coincidence Doppler broadening of positron annihilation radiation

Z Tang, M Hasegawa, Y Nagai, M Saito, Y Kawazoe - Physical Review B, 2002 - APS
We report a first-principles method for calculating the momentum density of positron-electron
pairs in materials, which can be accurately measured, in a wide momentum range, by …

Precipitation Behavior in High‐Purity Aluminium Alloys with Trace Elements–The Role of Quenched‐in Vacancies

F Lotter, U Muehle, M Elsayed, AM Ibrahim… - … status solidi (a), 2018 - Wiley Online Library
The main mechanism for the strengthening of aluminium‐copper alloys of the 2xxx type is
hardening by copper‐rich precipitates. However, their size, distribution, and crystal structure …

Ga sublattice defects in (Ga, Mn) As: Thermodynamical and kinetic trends

F Tuomisto, K Pennanen, K Saarinen, J Sadowski - Physical review letters, 2004 - APS
We have used positron annihilation spectroscopy and infrared absorption measurements to
study the Ga sublattice defects in epitaxial G a 1-x M nx A s with Mn content varying from 0 …

Determination of the charge carrier compensation mechanism in Te-doped GaAs by scanning tunneling microscopy

J Gebauer, ER Weber, ND Jäger, K Urban… - Applied physics …, 2003 - pubs.aip.org
We identified the charge carrier compensation mechanism in Te-doped GaAs with
atomically resolved scanning tunneling microscopy. Three types of defects were found …

Observation of high-temperature thermal vacancies in quasicrystals

K Sato, F Baier, AA Rempel, W Sprengel, HE Schaefer - Physical Review B, 2003 - APS
Abstract In quasicrystalline Al 70 Pd 21 Mn 9, atomic processes as, eg, thermal vacancy
formation are studied specifically by a combination of positron lifetime and two-detector …

Identification of defect properties by positron annihilation in Te-doped GaAs after Cu in-diffusion

M Elsayed, R Krause-Rehberg, W Anwand… - Physical Review B …, 2011 - APS
Positron lifetime measurements and Doppler-broadening spectroscopy were combined to
investigate the defect properties during Cu diffusion in Te-doped GaAs. The diffusion of Cu …

Identification of As-vacancy complexes in Zn-diffused GaAs

M Elsayed, R Krause-Rehberg, B Korff… - Journal of Applied …, 2013 - pubs.aip.org
We have used positron annihilation spectroscopy to study the introduction of point defects in
Zn-diffused semi-insulating GaAs. The diffusion was performed by annealing the samples for …