Kickback noise reduction techniques for CMOS latched comparators

PM Figueiredo, JC Vital - … on Circuits and Systems II: Express …, 2006 - ieeexplore.ieee.org
The latched comparator is a building block of virtually all analog-to-digital converter
architectures. It uses a positive feedback mechanism to regenerate the analog input signal …

A 10-b 120-Msample/s time-interleaved analog-to-digital converter with digital background calibration

SM Jamal, D Fu, NCJ Chang, PJ Hurst… - IEEE Journal of Solid …, 2002 - ieeexplore.ieee.org
Digital calibration using adaptive signal processing corrects for offset mismatch, gain
mismatch, and sample-time error between time-interleaved channels in a 10-b 120 …

Low kickback noise techniques for CMOS latched comparators

PM Figueiredo, JC Vital - 2004 IEEE International Symposium …, 2004 - ieeexplore.ieee.org
The latched comparator is utilized in virtually all analog-to-digital converter architectures. It
uses a positive feedback mechanism to regenerate the analog input signal into a full-scale …

A 55-mW, 10-bit, 40-Msample/s Nyquist-rate CMOS ADC

I Mehr, L Singer - IEEE Journal of Solid-State Circuits, 2000 - ieeexplore.ieee.org
A low-power 10-bit converter that can sample input frequencies above 100 MHz is
presented. The converter consumes 55 mW when sampling at f/sub s/= 40 MHz from a 3-V …

[图书][B] The VLSI handbook

WK Chen - 1999 - taylorfrancis.com
Over the years, the fundamentals of VLSI technology have evolved to include a wide range
of topics and a broad range of practices. To encompass such a vast amount of knowledge …

[图书][B] Top-down design of high-performance sigma-delta modulators

F Medeiro, BP Verdú, A Rodríguez-Vázquez - 2013 - books.google.com
The interest for: I:~ modulation-based NO converters has significantly increased in the last
years. The reason for that is twofold. On the one hand, unlike other converters that need …

A digital background calibration technique for time-interleaved analog-to-digital converters

D Fu, KC Dyer, SH Lewis… - IEEE Journal of Solid-State …, 1998 - ieeexplore.ieee.org
A 10-bit 40-Msample/s two-channel parallel pipelined ADC with monolithic digital
background calibration has been designed and fabricated in a 1/spl mu/m CMOS …

An embedded 240-mW 10-b 50-MS/s CMOS ADC in 1-mm/sup 2

K Bult, A Buchwald - IEEE Journal of Solid-State Circuits, 1997 - ieeexplore.ieee.org
A distributed-gain preamplifier uses averaging to improve resolution by 4 b in differential
nonlinearity (DNL) and 2 b in integral nonlinearity (INL) in a flash analog-to-digital converter …

A 250-mW, 8-b, 52-Msamples/s parallel-pipelined A/D converter with reduced number of amplifiers

K Nagaraj, HS Fetterman, J Anidjar… - IEEE Journal of Solid …, 1997 - ieeexplore.ieee.org
A parallel-pipelined A/D converter with an area and power efficient architecture is described.
By sharing amplifiers along the pipeline and also completely eliminating the amplifier from …

An analog background calibration technique for time-interleaved analog-to-digital converters

KC Dyer, D Fu, SH Lewis… - IEEE Journal of Solid-State …, 1998 - ieeexplore.ieee.org
Analog background calibration using adaptive signal processing, an extra channel, and
mixed signal integrators matches the offsets and gains of time-interleaved channels in a 10 …