Accelerated life method and assessment for storage vacuum electronic device
H Yuan, J Feng, X Sun - Journal of Instrumentation, 2019 - iopscience.iop.org
We proposed an accelerated life testing method for the storage vacuum electronic devices
(SVED) based on pressurization according to the relationship between gas inflow rate and …
(SVED) based on pressurization according to the relationship between gas inflow rate and …