State of the art and future perspectives in advanced CMOS technology

HH Radamson, H Zhu, Z Wu, X He, H Lin, J Liu… - Nanomaterials, 2020 - mdpi.com
The international technology roadmap of semiconductors (ITRS) is approaching the
historical end point and we observe that the semiconductor industry is driving …

Nanowire & nanosheet FETs for ultra-scaled, high-density logic and memory applications

A Veloso, T Huynh-Bao, P Matagne, D Jang… - Solid-State …, 2020 - Elsevier
We report on vertically stacked lateral nanowires (NW)/nanosheets (NS) gate-all-around
(GAA) FET devices as promising candidates to obtain a better power-performance metric for …

Enabling energy efficiency and polarity control in germanium nanowire transistors by individually gated nanojunctions

J Trommer, A Heinzig, U Muhle, M Loffler, A Winzer… - ACS …, 2017 - ACS Publications
Germanium is a promising material for future very large scale integration transistors, due to
its superior hole mobility. However, germanium-based devices typically suffer from high …

Vertical GeSn nanowire MOSFETs for CMOS beyond silicon

M Liu, Y Junk, Y Han, D Yang, JH Bae… - Communications …, 2023 - nature.com
The continued downscaling of silicon CMOS technology presents challenges for achieving
the required low power consumption. While high mobility channel materials hold promise for …

Ge GAA FETs and TMD finfets for the applications beyond Si—A review

YJ Lee, GL Luo, FJ Hou, MC Chen… - IEEE Journal of the …, 2016 - ieeexplore.ieee.org
Two parts of work are included in this paper. In the first part, the novel Ge gate-all-around
field effect transistors (GAA FETs) are introduced and discussed. Fabrication of Ge GAA …

Ge0.95Sn0.05 Gate-All-Around p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Sub-3 nm Nanowire Width

Y Kang, S Xu, K Han, EYJ Kong, Z Song, S Luo… - Nano …, 2021 - ACS Publications
We demonstrate Ge0. 95Sn0. 05 p-channel gate-all-around field-effect transistors (p-
GAAFETs) with sub-3 nm nanowire width (W NW) on a GeSn-on-insulator (GeSnOI) …

Strained germanium gate-all-around PMOS device demonstration using selective wire release etch prior to replacement metal gate deposition

L Witters, H Arimura, F Sebaai… - IEEE transactions on …, 2017 - ieeexplore.ieee.org
Strained Ge p-channel gate-all-around (GAA) devices with Si-passivation are demonstrated
on high-density 45-nm active pitch starting from 300-mm SiGe strain relaxed buffer wafers …

Fast growth synthesis of mesoporous germanium films by high frequency bipolar electrochemical etching

YA Bioud, A Boucherif, A Belarouci, E Paradis… - Electrochimica …, 2017 - Elsevier
Mesoporous germanium (MP-Ge) has been predicted to play an important role in a wide
range of potential applications. These porous Ge networks are characterized by physical …

III-V/Ge MOS device technologies for low power integrated systems

S Takagi, M Noguchi, M Kim, SH Kim, CY Chang… - Solid-State …, 2016 - Elsevier
CMOS utilizing high mobility III-V/Ge channels on Si substrates is expected to be one of the
promising devices for high performance and low power integrated systems in the future …

ION Enhancement of Ge0.98Si0.02 Nanowire nFETs by High-κ Dielectrics

YR Chen, Z Zhao, CT Tu, YC Liu… - IEEE Electron …, 2022 - ieeexplore.ieee.org
The HfxZryO2 with high Zr content is demonstrated to form the anti-ferroelectric tetragonal
phase (AFE t-phase). The peak dielectric constant (47) of Hf0. 2Zr0. 8O2 is achieved. By …