Currently, the portable electronic products trend to high speed, light weight, miniaturization and multifunctionality. In that field, solder joint reliability in term of both drop impact and …
PF Yang, YS Lai, SR Jian, J Chen, RS Chen - Materials Science and …, 2008 - Elsevier
We report in this paper Young's moduli and hardness of Cu6Sn5, Cu3Sn, and Ni3Sn4 intermetallic compounds (IMCs) measured by nanoindentation. The samples were prepared …
M Amagai - Microelectronics Reliability, 2008 - Elsevier
Co, Ni, Pt, Al, P, Cu, Zn, Ge, Ag, In, Sb or Au inclusions in Sn–Ag based lead free solders were evaluated to study if these nanoparticles can reduce the growth of intermetallic …
FX Che, JHL Pang - IEEE Transactions on Device and Materials …, 2012 - ieeexplore.ieee.org
In this paper, thermal cycling tests and finite-element analysis (FEA) for a plastic ball grid array package with Sn-3.8 Ag-0.7 Cu lead-free solder joints have been performed. The …
CC Lee, PJ Wang, JS Kim - 2007 Proceedings 57th Electronic …, 2007 - ieeexplore.ieee.org
In nearly all soldering processes, it is the intermetallic (IMC) layer that bonds the solder to the base metal. Thus, the IMC layer is necessary for any successful soldering operation …
L Xu, JHL Pang, F Che - Journal of Electronic Materials, 2008 - Springer
The electronic packaging industry uses electroless nickel immersion gold (ENIG) or Cu- organic solderability preservative (Cu-OSP) as a bonding pad surface finish for solder joints …
DA Shnawah, SBM Said, MFM Sabri… - Journal of electronic …, 2012 - Springer
Abstract Sn-Ag-Cu (SAC) alloy is currently recognized as the standard lead-free solder alloy for packaging of interconnects in the electronics industry, and high-Ag-content SAC alloys …
N Chawla - International Materials Reviews, 2009 - Taylor & Francis
Electronic packaging is a critical part of products such as computers, cellular phones, automotive components and other electronic devices. The package must be tailored to …
J Mehrmashhadi, Y Tang, X Zhao, Z Xu… - IEEE Transactions …, 2018 - ieeexplore.ieee.org
We investigate the drop reliability of different solder joint microstructures using a coupled board-level finite-element (FE) analysis and the microscale peridynamic (PD) simulations …