Conventional optics in the radio frequency (rf) through far-infrared (FIR) regime cannot
resolve microscopic features since resolution in the far field is limited by wavelength. With …

The basic physics behind the interaction of ions with solid-state matter is discussed, with an
emphasis on the formation of interaction products between the ions and target atoms …

Near-field microwave microscopy is concerned with quantitative measurement of the
microwave electrodynamic response of materials on length scales far shorter than the free …

Molecular electronics originally proposed that small molecules sandwiched between
electrodes would accomplish electronic functions and enable ultimate scaling to be reached …

Впервые в отечественной научно-технической литературе в объеме одной книги
детально рассмотрены теоретические основы, физические механизмы и принципы …

In this article we describe evanescent field imaging of material nonuniformities with a record
resolution of 0.4 μm at 1 GHz (λ g/750 000), using a resonant stripline scanning microwave …

We describe quantitative imaging of the sheet resistance of metallic thin films by monitoring
frequency shift and quality factor in a resonant scanning near-field microwave microscope …

Design, fabrication, and characterization of near-field microwave scanning probes
compatible with an atomic force microscope (AFM) for imaging of embedded nanostructures …

We report on an adjustable interferometric set-up for Scanning Microwave Microscopy. This
interferometer is designed in order to combine simplicity, a relatively flexible choice of the …

The near-field scanning microwave microscope (NSMM) can quantitatively image materials
properties at length scales far shorter than the free space wavelength (λ)⁠. Here we report a …