Semiconductor manufacturing processes are very long and complex, needing several
hundreds of individual steps to produce the final product (chip). In this context, the early …

Process variables in manufacturing process are critical to the final quality of product,
especially in continuous process. Their abnormal fluctuations may cause many quality …

This paper studies the effect of type-II inspection errors on the effectiveness of a quality
inspection plan designed utilizing a risk exposure control approach. To do so, the probability …

Aim: Recent mediatic recalls of products illustrate the losses in terms of cost and reputation
induced by non-conformities reaching end customer. The purpose of this paper is to master …

The measurement of lots to check process quality is crucial but also a non-added value
operation in manufacturing systems. This paper is motivated by semiconductor …

This paper studies the effects of process learning and product lifecycle phenomena on risk-
based quality control plans (RBQCP) in the context of job shop manufacturing systems. The …

Dans un contexte où la puissance de calcul des ordinateurs est en constante augmentation,
et où de plus en plus de données sont recueillies par les organisations, ces dernières s' …

Dans cette thèse, nous avons travaillé sur le problème de la mise œuvre des plans de
contrôle dynamique au sein d'un environnement semi-conducteur multi-produits. Nous nous …