Solid heterostructures composed of substrates and epitaxial films are extensively used in
advanced technologies, and their thermophysical properties fundamentally determine the …

The optical constants of fiber materials are of great value in the study of the mechanism and
application of radiation regulation, but the conventional methods for obtaining the optical …

Atomic thickness thin films are critical functional materials and structures in atomic and close-
to-atomic scale manufacturing. However, fast, facile, and highly sensitive precision …

Low refractive index (RI) porous dielectrics at optical frequencies, serving as subwavelength
effective media for versatile photonic utilization, still face great challenges in realizing …

The morphological evolution of Ge layers growing on the SiO 2/Si (100) substrate by photo-
excited chemical vapor deposition was traced through an analysis of pseudodielectric …

Morphological structures of two-dimensional (2D) Ge thin films and three-dimensional (3D)
Ge dots/islands grown on SiO 2 substrates were analyzed with UV–visible spectroscopic …

The optical coefficients and thickness of thin films are essential parameters in many
branches of science and technology. Ellipsometry is a well-known and powerful technique …

ضرایب اپتیکی و ضخامت لایه‌های نازک در بسیاری از شاخه‌های علوم و فناوری پارامترهای اساسی
محسوب می‌شوند. بیضی‌سنجی روش شناخته‌شده و قدرتمندی برای محاسبۀ پارامترهای اساسی لایه‌های …‎