A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences

N Jalili, K Laxminarayana - Mechatronics, 2004 - Elsevier
The atomic force microscope (AFM) system has evolved into a useful tool for direct
measurements of micro-structural parameters and unraveling the intermolecular forces at …

Atomic force microscopy for nanoscale mechanical property characterization

G Stan, SW King - Journal of Vacuum Science & Technology B, 2020 - pubs.aip.org
Over the past several decades, atomic force microscopy (AFM) has advanced from a
technique used primarily for surface topography imaging to one capable of characterizing a …

Contact mechanics and tip shape in AFM-based nanomechanical measurements

M Kopycinska-Müller, RH Geiss, DC Hurley - Ultramicroscopy, 2006 - Elsevier
Stiffness–load curves obtained in quantitative atomic force acoustic microscopy (AFAM)
measurements depend on both the elastic properties of the sample and the geometry of the …

Measurement of Young's modulus of clay minerals using atomic force acoustic microscopy

M Prasad, M Kopycinska, U Rabe… - Geophysical research …, 2002 - Wiley Online Library
The presence of clay minerals, hydrous aluminosilicates that are smaller than 2 μm can alter
the elastic and plastic behavior of materials significantly. We have used Atomic Force …

Nano-to microscale wear and mechanical characterization using scanning probe microscopy

B Bhushan - Wear, 2001 - Elsevier
Scanning probe microscopy (SPM) techniques, specifically so-called atomic force/friction
force microscopy (AFM/FFM) are increasingly used for tribological studies of engineering …

30 years of atomic force microscopy: creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners

H Habibullah - Measurement, 2020 - Elsevier
This paper presents a brief history of scanning probe microscopes (SPMs) and a general
insight into an atomic force microscope (AFM), including its operating principles, modes …

Young's modulus, Poisson's ratio and failure properties of tetrahedral amorphous diamond-like carbon for MEMS devices

S Cho, I Chasiotis, TA Friedmann… - … of Micromechanics and …, 2005 - iopscience.iop.org
The elastic and failure mechanical properties of hydrogen-free tetrahedral amorphous
carbon (ta-C) MEMS structures were investigated via in situ direct and local displacement …

Atomic force acoustic microscopy

U Rabe - Applied scanning probe methods II: scanning probe …, 2006 - Springer
Materials with an artificial nanostructure such as nanocrystalline metals and ceramics or
matrix embedded nanowires or nanoparticles are advancing into application. Polymer …

AFM and acoustics: fast, quantitative nanomechanical mapping

BD Huey - Annu. Rev. Mater. Res., 2007 - annualreviews.org
Combining atomic force microscopy and ultrasonic methods allows near-field detection of
acoustic signals and thereby otherwise inaccessible nanoscale mechanical …

Contact resonance force microscopy techniques for nanomechanical measurements

B Bhushan, H Fuchs, DC Hurley - Applied Scanning Probe Methods XI …, 2009 - Springer
Contact resonance force microscopy (CR-FM) methods such as atomic force acoustic
microscopy show great promise as tools for nanoscale materials research. However …