Recent advances in GaN‐based power HEMT devices

J He, WC Cheng, Q Wang, K Cheng… - Advanced electronic …, 2021 - Wiley Online Library
The ever‐increasing power density and operation frequency in electrical power conversion
systems require the development of power devices that can outperform conventional Si …

A review of gan hemt dynamic on-resistance and dynamic stress effects on field distribution

L Gill, S DasGupta, JC Neely, RJ Kaplar… - … on Power Electronics, 2023 - ieeexplore.ieee.org
Gallium nitride (GaN) is an emerging wide-bandgap material with superior physical
characteristics, including critical electric field, electron mobility, and specific on-resistance …

[PDF][PDF] Effect of Different Etching Time on Fabrication of an Optoelectronic Device Based on GaN/Psi.

HD Jabbar, MA Fakhri, MJ Abdul Razzaq… - Journal of …, 2023 - cdn.techscience.cn
Gallium nitride (GaN)/porous silicon (PSi) film was prepared using a pulsed laser deposition
method and 1064 nm Nd: YAG laser for optoelectronic applications and a series of Psi …

Deep-level traps in AlGaN/GaN-and AlInN/GaN-based HEMTs with different buffer doping technologies

PV Raja, M Bouslama, S Sarkar… - … on Electron Devices, 2020 - ieeexplore.ieee.org
Deep-level traps in AlGaN/GaNand AlInN/GaN-based HEMTs with different buffer doping
technologies are identified by drain current transient spectroscopy (DCTS) and low …

Al diffusion at AlN/Si interface and its suppression through substrate nitridation

L Wei, X Yang, J Shen, D Liu, Z Cai, C Ma, X He… - Applied Physics …, 2020 - pubs.aip.org
One of the challenges for GaN-on-Si radio frequency (RF) device applications is the RF loss,
which is mainly associated with a parasitic channel formed at the interface of AlN and high …

AlGaN/GaN on SiC devices without a GaN buffer layer: Electrical and noise characteristics

J Jorudas, A Šimukovič, M Dub, M Sakowicz… - Micromachines, 2020 - mdpi.com
We report on the high-voltage, noise, and radio frequency (RF) performances of aluminium
gallium nitride/gallium nitride (AlGaN/GaN) on silicon carbide (SiC) devices without any GaN …

Trap-assisted degradation mechanisms in E-mode p-GaN power HEMT: A review

P Nautiyal, P Pande, VS Kundu… - Microelectronics …, 2022 - Elsevier
Abstract Transistor-based on Gallium Nitride (GaN) technology, has enabled energy-saving
power electronics to alleviate global energy utilization. Being the initial stages of the …

Identification of semi-ON-state current collapse in AlGaN/GaN HEMTs by drain current deep level transient spectroscopy

Y Yao, S Huang, Q Jiang, X Wang, L Bi… - IEEE Electron …, 2021 - ieeexplore.ieee.org
A drain-controlled current-mode deep level transient spectroscopy (I-DLTS), was developed
for investigation of Semi-ON-state current collapse in AlGaN/GaN high electron mobility …

Accurate Measurement of Dynamic on-State Resistances of GaN Devices Under Reverse and Forward Conduction in High Frequency Power Converter

K Li, A Videt, N Idir, PL Evans… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Because of trapped charges in GaN transistor structure, device dynamic on-state resistance
R_DSon is increased when it is operated in high frequency switched power converters, in …

Compensation dopant-free GaN-on-Si HEMTs with a polarization engineered buffer for RF applications

A Gowrisankar, VS Charan… - … on Electron Devices, 2023 - ieeexplore.ieee.org
We report on the performance of compensation doping-free aluminum gallium-nitride
(AlGaN)/gallium-nitride (GaN) high-electron mobility transistors (HEMTs) realized using a …