BeGAN: Power grid benchmark generation using a process-portable GAN-based methodology

VA Chhabria, K Kunal, M Zabihi… - 2021 IEEE/ACM …, 2021 - ieeexplore.ieee.org
Evaluating CAD solutions to physical implementation problems has been extremely
challenging due to the unavailability of modern benchmarks in the public domain. This work …

Full chip impact study of power delivery network designs in monolithic 3D ICs

SK Samal, K Samadi, P Kamal, Y Du… - 2014 IEEE/ACM …, 2014 - ieeexplore.ieee.org
In this paper, we present a comprehensive study on the impact of power delivery network
(PDN) on full-chip wirelength, routability, power, and thermal effects in monolithic 3D ICs …

Full chip impact study of power delivery network designs in gate-level monolithic 3-D ICs

SK Samal, K Samadi, P Kamal, Y Du… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
In this paper, we present a comprehensive study on the impact of power delivery network
(PDN) on full-chip wirelength, routability, power, and thermal effects in gate-level monolithic …

SRAM-PG: Power Delivery Network Benchmarks from SRAM Circuits

S Shen, Z Liu, W Yu - 2024 25th International Symposium on …, 2024 - ieeexplore.ieee.org
Designing the power delivery network (PDN) in very large-scale integrated (VLSI) circuits is
increasingly important, especially for nowadays low-power integrated circuit (IC) design. In …

Efficient region-aware P/G TSV planning for 3D ICs

S Yao, X Chen, Y Wang, Y Ma, Y Xie… - … Symposium on Quality …, 2014 - ieeexplore.ieee.org
Power delivery network (PDN) design is one of the most critical challenges in 3D Integrated
Circuits (IC) design. In existing studies, to ensure the robustness of the 3D PDN, the number …

Actively alleviate power gating-induced power/ground noise using parasitic capacitance of on-chip memories in MPSoC

X Wang, J Xu, W Zhang, X Wu, Y Ye… - … Transactions on very …, 2014 - ieeexplore.ieee.org
By integrating multiple processing units (PUs) and memories on a single chip,
multiprocessor system-on-chip (MPSoC) can provide higher performance per energy and …

HS3DPG: Hierarchical simulation for 3D P/G network

S Tao, X Chen, Y Wang, Y Ma, Y Shi… - 2013 18th Asia and …, 2013 - ieeexplore.ieee.org
As different chips are stacked together in 3D ICs, the power/ground (P/G) network simulation
becomes more challenging than that of 2D cases. In this paper, we propose a hierarchical …

Novel crack sensor for tsv-based 3d integrated circuits: design and deployment perspectives

C Zhang, M Jung, SK Lim, Y Shi - 2013 IEEE/ACM International …, 2013 - ieeexplore.ieee.org
The CTE mismatch-induced stress in 3D ICs may initiate cracks from the interface between a
TSV and its dielectric liner, and propagates them on the silicon substrate surface. If a crack …

HS3-DPG: hierarchical simulation for 3-DP/G network

Y Wang, S Yao, S Tao, X Chen, Y Ma… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
As different tiers are stacked together in 3-D integrated circuits, the power/ground (P/G)
network simulation becomes more challenging than that of 2-D cases. In this brief, we …

Memcomputing: The cape of good hope:[Extended special session description]

Y Shi, HM Chen - 2014 Design, Automation & Test in Europe …, 2014 - ieeexplore.ieee.org
Energy efficiency has emerged as a major barrier to performance scalability for modern
processors. On the other hand, significant breakthroughs have been achieved in memory …