A Novel DNU Self-Recoverable and SET Pulse Filterable Latch Design for Aerospace Applications
S Wang, L Wang, M Guo, Y Li, B Li - electronics, 2023 - mdpi.com
This paper presents a novel double node upset (DNU) self-recoverable and single event
transient (SET) pulse filterable latch design in 28 nm CMOS technology. The loop structure …
transient (SET) pulse filterable latch design in 28 nm CMOS technology. The loop structure …
A Novel Radiation-Hardened CCDM-TSPC Compared with Seven Well-Known RHBD Flip-Flops in 180 nm CMOS Process
S Wang, L Wang, Y Wang, M Guo, Y Li - Electronics, 2022 - mdpi.com
Numerous radiation-hardened-by-design (RHBD) flip-flops have been developed to
increase the dependability of digital chips for space applications over the past two decades …
increase the dependability of digital chips for space applications over the past two decades …
A Complementary Survey of Radiation-Induced Soft Error Research: Facilities, Particles, Devices and Trends
Soft errors caused by external radiation sources have historically affected the reliability of
electronic devices. The radiation effects community has dedicated significant effort to …
electronic devices. The radiation effects community has dedicated significant effort to …
Sequential Circuit Temporal Hardening on an Advanced finFET Process
CS YoungSciortino - 2022 - search.proquest.com
Microelectronic circuits are prone to upsets in the natural and manmade radiation
environments. As the scaling of these circuits continues, they have become more …
environments. As the scaling of these circuits continues, they have become more …