HSP Wong - IBM Journal of Research and Development, 2002 - ieeexplore.ieee.org
This paper focuses on approaches to continuing CMOS scaling by introducing new device structures and new materials. Starting from an analysis of the sources of improvements in …
The design of analog and RF circuits in CMOS technology has become increasingly more difficult as device modeling faces new challenges in the deep-submicrometer regime and …
K Uchida, S Takagi - Applied Physics Letters, 2003 - pubs.aip.org
We demonstrate that carrier scattering induced by the thickness fluctuation of a silicon-on- insulator (SOI) film reduces electron mobility in ultrathin-body metal–oxide–semiconductor …
PM Solomon, KW Guarini, Y Zhang… - IEEE circuits and …, 2003 - ieeexplore.ieee.org
A planar self-aligned double-gate MOSFET process has been implemented where a unique sidewall source/drain structure (S/D) permits self-aligned patterning of the back-gate layer …
In this paper, we present a comprehensive experimental characterization of electron and hole effective mobility (/spl mu//sub eff/) of ultrathin SOI n-and p-MOSFETs. Measurements …
K Uchida, J Koga, S Takagi - Journal of Applied Physics, 2007 - pubs.aip.org
The electron mobility in ultrathin-body (UTB) silicon-on-insulator (SOI) metal-oxide- semiconductor field-effect transistors (MOSFETs) with SOI thicknesses from 2.3 to 60 nm is …
Understand the theory, design and applications of the two principal candidates for the next mainstream semiconductor-industry device with this concise and clear guide to FD/UTB …
R Das, M Chanda, CK Sarkar - IEEE Transactions on Electron …, 2018 - ieeexplore.ieee.org
In this paper, analytical modeling of a charge plasma-based nanogap embedded surrounding gate MOSFET biosensor for label-free biosensing has been presented and …
This paper presents a systematic study of the subthreshold analog/RF performance for underlap double gate (UDG) NMOSFETs using high dielectric constant (k) spacers. The …