Modifying the Power and Performance of 2-Dimensional MoS2 Field Effect Transistors

F Zhuo, J Wu, B Li, M Li, CL Tan, Z Luo, H Sun, Y Xu… - Research, 2023 - spj.science.org
Over the past 60 years, the semiconductor industry has been the core driver for the
development of information technology, contributing to the birth of integrated circuits …

Beyond the conventional transistor

HSP Wong - IBM Journal of Research and Development, 2002 - ieeexplore.ieee.org
This paper focuses on approaches to continuing CMOS scaling by introducing new device
structures and new materials. Starting from an analysis of the sources of improvements in …

Influence of channel and gate engineering on the analog and RF performance of DG MOSFETs

N Mohankumar, B Syamal… - IEEE transactions on …, 2010 - ieeexplore.ieee.org
The design of analog and RF circuits in CMOS technology has become increasingly more
difficult as device modeling faces new challenges in the deep-submicrometer regime and …

Carrier scattering induced by thickness fluctuation of silicon-on-insulator film in ultrathin-body metal–oxide–semiconductor field-effect transistors

K Uchida, S Takagi - Applied Physics Letters, 2003 - pubs.aip.org
We demonstrate that carrier scattering induced by the thickness fluctuation of a silicon-on-
insulator (SOI) film reduces electron mobility in ultrathin-body metal–oxide–semiconductor …

Two gates are better than one [double-gate MOSFET process]

PM Solomon, KW Guarini, Y Zhang… - IEEE circuits and …, 2003 - ieeexplore.ieee.org
A planar self-aligned double-gate MOSFET process has been implemented where a unique
sidewall source/drain structure (S/D) permits self-aligned patterning of the back-gate layer …

Low field electron and hole mobility of SOI transistors fabricated on ultrathin silicon films for deep submicrometer technology application

D Esseni, M Mastrapasqua, GK Celler… - … on Electron Devices, 2001 - ieeexplore.ieee.org
In this paper, we present a comprehensive experimental characterization of electron and
hole effective mobility (/spl mu//sub eff/) of ultrathin SOI n-and p-MOSFETs. Measurements …

Experimental study on electron mobility in ultrathin-body silicon-on-insulator metal-oxide-semiconductor field-effect transistors

K Uchida, J Koga, S Takagi - Journal of Applied Physics, 2007 - pubs.aip.org
The electron mobility in ultrathin-body (UTB) silicon-on-insulator (SOI) metal-oxide-
semiconductor field-effect transistors (MOSFETs) with SOI thicknesses from 2.3 to 60 nm is …

[图书][B] Fundamentals of Ultra-thin-body MOSFETs and FinFETs

JG Fossum, VP Trivedi - 2013 - books.google.com
Understand the theory, design and applications of the two principal candidates for the next
mainstream semiconductor-industry device with this concise and clear guide to FD/UTB …

Analytical modeling of charge plasma-based optimized nanogap embedded surrounding gate MOSFET for label-free biosensing

R Das, M Chanda, CK Sarkar - IEEE Transactions on Electron …, 2018 - ieeexplore.ieee.org
In this paper, analytical modeling of a charge plasma-based nanogap embedded
surrounding gate MOSFET biosensor for label-free biosensing has been presented and …

Subthreshold analog/RF performance enhancement of underlap DG FETs with high-k spacer for low power applications

K Koley, A Dutta, B Syamal, SK Saha… - IEEE transactions on …, 2012 - ieeexplore.ieee.org
This paper presents a systematic study of the subthreshold analog/RF performance for
underlap double gate (UDG) NMOSFETs using high dielectric constant (k) spacers. The …