Electrostatic pull-in instability in MEMS/NEMS: A review

WM Zhang, H Yan, ZK Peng, G Meng - Sensors and Actuators A: Physical, 2014 - Elsevier
Pull-in instability as an inherently nonlinear and crucial effect continues to become
increasingly important for the design of electrostatic MEMS and NEMS devices and ever …

Research and analysis of MEMS switches in different frequency bands

W Tian, P Li, LX Yuan - Micromachines, 2018 - mdpi.com
Due to their high isolation, low insertion loss, high linearity, and low power consumption,
microelectromechanical systems (MEMS) switches have drawn much attention from …

Silicon nitride nanopores formed by simple chemical etching: DNA translocations and TEM imaging

Z Xia, A Scott, R Keneipp, J Chen, DJ Niedzwiecki… - ACS …, 2022 - ACS Publications
We demonstrate DNA translocations through silicon nitride pores formed by simple chemical
etching on glass substrates using microscopic amounts of hydrofluoric acid. DNA …

Analytical approach in the development of RF MEMS switches

IE Lysenko, AV Tkachenko, EV Sherova, AV Nikitin - Electronics, 2018 - mdpi.com
Currently, the technology of microelectromechanical systems is widely used in the
development of high-frequency and ultrahigh-frequency devices. The most important …

On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel …

U Zaghloul, G Papaioannou, B Bhushan… - Microelectronics …, 2011 - Elsevier
This paper reviews the state of the art knowledge related to critical failure mechanisms in
electrostatic micro-and nano-electromechanical systems (MEMS and NEMS) which are the …

[HTML][HTML] The study of surface wetting, nanobubbles and boundary slip with an applied voltage: A review

Y Pan, B Bhushan, X Zhao - Beilstein journal of …, 2014 - beilstein-journals.org
The drag of fluid flow at the solid–liquid interface in the micro/nanoscale is an important
issue in micro/nanofluidic systems. Drag depends on the surface wetting, nanobubbles …

Influences of different sputtering current on the microstructure and electrical properties of silicon nitride thin films deposited on cemented carbide tools

D Zhou, L Huang, J Yuan, C Li - Ceramics International, 2021 - Elsevier
Silicon nitride (SiN x) thin films, owing to their high hardness and great insulation
performance, show a great prospect for application in smart temperature-measurement …

Reliability issue related to dielectric charging in capacitive micromachined ultrasonic transducers: A review

J Munir, Q Ain, HJ Lee - Microelectronics Reliability, 2019 - Elsevier
The long-term reliability of MEMS devices related to the dielectric charging phenomenon is
one of the main hurdles in the commercialization of these devices. This paper presents a …

On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS …

U Zaghloul, B Bhushan, P Pons… - …, 2010 - iopscience.iop.org
In this paper, we investigate the impact of environment gases and relative humidity on
dielectric charging phenomenon in electrostatically actuated micro-and nano …

Challenges and issues of using polymers as structural materials in MEMS: A review

Y Li - Journal of Microelectromechanical Systems, 2018 - ieeexplore.ieee.org
Polymers are ever more widely and more prominently used in microelectromechanical
systems. They provide significant added value to the existing silicon-based technologies …