Dependable dnn accelerator for safety-critical systems: A review on the aging perspective

I Moghaddasi, S Gorgin, JA Lee - IEEE Access, 2023 - ieeexplore.ieee.org
In the modern era, artificial intelligence (AI) and deep learning (DL) seamlessly integrate into
various spheres of our daily lives. These cutting-edge disciplines have given rise to …

Preparation of different conjugated polymers characterized by complementary electronic properties from an identical precursor

M Carlotti, T Losi, F De Boni, FM Vivaldi… - Polymer …, 2023 - pubs.rsc.org
The possibility of generating regions with different electronic properties within the same
organic semiconductor thin film could offer novel opportunities for designing and fabricating …

Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology

J Diaz-Fortuny, P Saraza-Canflanca… - 2024 IEEE …, 2024 - ieeexplore.ieee.org
Integrated circuits (IC) are the heart of all electronic systems in critical sectors like
automotive, aerospace, or healthcare, in key infrastructures like telecommunications …

An In-Depth Study of Ring Oscillator Reliability under Accelerated Degradation and Annealing to Unveil Integrated Circuit Usage

J Diaz-Fortuny, P Saraza-Canflanca, E Bury… - Micromachines, 2024 - mdpi.com
The reliability and durability of integrated circuits (ICs), present in almost every electronic
system, from consumer electronics to the automotive or aerospace industries, have been …

Time-dependent statistical NBTI model for aging assessment in circuit level implemented with open model interface

M Zheng, W Chen, Y Lyu, H Chen, J Chen… - Microelectronics …, 2023 - Elsevier
As technology nodes continue to shrink, the impact of aging problems on devices has
become increasingly important. One significant aging problem that affects device …

A Study on the Reliability Evaluation of a 3D Packaging Storage Module under Temperature Cycling Ultimate Stress Conditions

S Zhou, K Ma, Y Wu, S Wang, N Cai - Micromachines, 2024 - mdpi.com
Based on the theory of reliability enhancement testing technology, this study used a variety
of testing combinations and finite element simulations to analyze the stress–strain properties …

[HTML][HTML] Multi-View Graph Learning for Path-Level Aging-Aware Timing Prediction

A Bu, X Li, Z Li, Y Chen - Electronics, 2024 - mdpi.com
As CMOS technology continues to scale down, the aging effect—known as negative bias
temperature instability (NBTI)—has become increasingly prominent, gradually emerging as …

Leveraging Public Information to Fit a Compact Hot Carrier Injection Model to a Target Technology

A Dimopoulos, M Sima, SW Neville - IEEE Access, 2023 - ieeexplore.ieee.org
The design of countermeasures against integrated circuit counterfeit recycling requires the
ability to simulate aging in CMOS devices. Electronic design automation tools commonly …

Study on ESD Protection Circuit by TCAD Simulation and TLP Experiment

F Li, C Chai, Y Liu, Y Song, L Wang, Y Yang - Micromachines, 2023 - mdpi.com
The anti-ESD characteristic of the electronic system is paid more and more attention.
Moreover, the on-chip electrostatic discharge (ESD) is necessary for integrated circuits to …

BPath-RO: A Performance-and Area-Efficient In Situ Delay Measurement Scheme for Digital IC

D Li, H Liang, H Zhang, Y Wang, M Yi, Y Lu, Z Huang - Electronics, 2023 - mdpi.com
Circuit delays are increasingly sensitive to process, voltage, temperature, and aging (PVTA)
variations, severely impacting circuit performance. Accurate measurement of circuit delay is …