We review the application of time-of-flight secondary-ion mass spectrometry (ToF-SIMS) for
the surface chemical identification and distribution analysis (mapping) of pharmaceutically …

A sputter beam, consisting of large O2 clusters, was used to record depth profiles of alkali
metal ions (Me+) within thin SiO2 layers. The O2 gas cluster ion beam (O2-GCIB) exhibits an …

The desorption of surface-adsorbed molecules induced by cluster-surface collisions of
neutral molecular clusters, in particular, SO 2 clusters, was investigated by means of …

Desorption of alkali halides upon collision of neutral SO2 clusters on Au and SiO2 surfaces
was investigated. For desorption of halogen species X, an ionic desorption channel of the …

To address the question of surface oxidation in organic electronics the chemical composition
at the surface of single crystalline rubrene is spatially profiled and analyzed using Time of …

This chapter discusses the case of organic and related materials, with a few examples taken
from other types of systems when deemed necessary. It focuses on problems of cluster …

Cluster secondary ion mass spectrometry is now widely used for the characterization of
nanostructures. In order to gain a better understanding of the physics of keV cluster …

A fast and accurate drug screening to identify the possible presence of a wide variety of
pharmaceutical and illicit drugs is increasingly requested in forensic and clinical toxicology …

Keywords: SIMS for organic films; 3D molecular depth profiling of organic materials;
chemical surface technique of vertical; lateral resolution; ultrathin organic mono-and …

Ionic liquids are currently in the focus of scientific research. Applications of ionic liquids can
be found in numerous chemical domains like synthetic chemistry, electrochemical storage …