Because of the demand for advanced measurement systems in the field of modern photonic
integrated circuits, optical frequency domain reflectometry (OFDR) is a robust technique for …

A novel, to the best of our knowledge, method to extract optical microring resonators' loss
characteristics is proposed and demonstrated using optical frequency domain reflectometry …

Adaptable and complex optical characterization of photonic integrated devices, permitting to
unearth possible design and fabrication errors in the different workflow steps are highly …

In this paper, we propose a technique to characterize integrated power splitters and
waveguide losses. Taking advantage of the time domain resolution of an optical frequency …

[EN] This PhD thesis covers the characterization of complex photonic integrated circuits
(PIC) by using Optical Frequency Domain Interferometry (OFDI). OFDI has a fairly simple …