Exploring the mysteries of system-level test
System-level test, or SLT, is an increasingly important process step in today's integrated
circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in …
circuit testing flows. Broadly speaking, SLT aims at executing functional workloads in …
Industrial Fault Diagnosis With Incremental Learning Capability Under Varying Sensory Data
Evolving monitoring requirements may necessitate the addition of new sensors or the
exclusion of old ones. Unfortunately, traditional data-driven fault diagnosis methods usually …
exclusion of old ones. Unfortunately, traditional data-driven fault diagnosis methods usually …
Model evolution mechanism for incremental fault diagnosis
L Guan, F Qiao, X Zhai, D Wang - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
As the key issue of equipment operation and maintenance, fault diagnosis has attracted
extensive attention, in which deep learning is often applied to the construction of fault …
extensive attention, in which deep learning is often applied to the construction of fault …
Black-box test-cost reduction based on Bayesian network models
R Pan, Z Zhang, X Li, K Chakrabarty… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
The growing complexity of circuit boards makes manufacturing test increasingly expensive.
In order to reduce test cost, a number of test selection methods have been proposed in the …
In order to reduce test cost, a number of test selection methods have been proposed in the …
[HTML][HTML] Deep Learning-Enhanced Defects Detection for Printed Circuit Boards
Printed circuit boards (PCBs) are an important component of electronic devices. Therefore,
ensuring the quality of such PCBs in the manufacturing process is crucial. Especially, cracks …
ensuring the quality of such PCBs in the manufacturing process is crucial. Especially, cracks …
Knowledge transfer in board-level functional fault diagnosis enabled by domain adaptation
High integration densities and design complexity make board-level functional fault diagnosis
extremely difficult. Machine-learning techniques can identify functional faults with high …
extremely difficult. Machine-learning techniques can identify functional faults with high …
Unsupervised root-cause analysis for integrated systems
R Pan, Z Zhang, X Li, K Chakrabarty… - 2020 IEEE International …, 2020 - ieeexplore.ieee.org
The increasing complexity and high cost of integrated systems has placed immense
pressure on root-cause analysis and diagnosis. In light of artificial intelligent and machine …
pressure on root-cause analysis and diagnosis. In light of artificial intelligent and machine …
Unsupervised two-stage root-cause analysis for integrated systems
R Pan, Z Zhang, X Li, K Chakrabarty… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
The increasing complexity and high cost of integrated systems have placed immense
pressure on root-cause analysis and diagnosis. In light of artificial intelligence and machine …
pressure on root-cause analysis and diagnosis. In light of artificial intelligence and machine …
Unsupervised root-cause analysis with transfer learning for integrated systems
R Pan, X Li, K Chakrabarty - 2021 IEEE 39th VLSI Test …, 2021 - ieeexplore.ieee.org
The increasing complexity of integrated systems has exacerbated the problems associated
with root-cause analysis. Leveraging advances artificial intelligence, a large amount of …
with root-cause analysis. Leveraging advances artificial intelligence, a large amount of …
Semi-supervised root-cause analysis with co-training for integrated systems
R Pan, X Li, K Chakrabarty - 2022 IEEE 40th VLSI Test …, 2022 - ieeexplore.ieee.org
The increasing complexity of integrated systems has exacerbated the challenges associated
with system diagnosis. To tackle these challenges, intelligent root-cause-analysis facilitated …
with system diagnosis. To tackle these challenges, intelligent root-cause-analysis facilitated …