Memory BIST implements March test techniques extensively for testing embedded memories
on a chip. A high-complexity test algorithm like the March MSS (18N) can guarantee the …

Dynamic faults detection is important in recent Random Access Memory (RAM)
technologies. However, there is less research performed to design memory test algorithms …

MBIST is a standard mechanism to test memory arrays and potentially detect all of the faults
that may be present inside the memory cells using an effective collection of algorithms …

Memory Built-In Self-Test (BIST) is a common method to test embedded memories on a chip
owing to its fast and low-cost testing. Its efficiency depends on the complexity and the fault …

Memory test and repair has been generally applied to improve memory yield. However, due
to the high cost of automatic test equipment (ATE) equipment, which has been employed for …

As the complexity of circuit design continues to grow, the development of three-dimensional
(3D) integrated circuit (IC) technology has become increasingly vital. While 3D ICs offer …

An algorithmic pattern generator (ALPG) has been developed within automatic test
equipment (ATE) due to the extensive number of test patterns required for testing the …

Abstract Memory Built-In Self-Test (MBIST) is essential in testing memories on a chip. Its
efficiency depends on its fault coverage and the complexity of the algorithm used, which …

Newer defects in memories arising from shrinking manufacturing technologies demand
improved memory testing methodologies. The percentage of memories on chips continues …

As memories dominate the system-on-chip (SoC), their quality significantly impacts the chip
manufacturing yield. There is a growing need to reduce the chip production time and cost …