[HTML][HTML] Study of reactive electron beam deposited tantalum penta oxide thin films with spectroscopic ellipsometry and atomic force microscopy
The optical and surface morphological properties of thin films are profoundly influenced by
the deposition technique and the various process parameters employed. In present work …
the deposition technique and the various process parameters employed. In present work …
Photo- and thermally induced property change in Ag diffusion into Ag/As2Se3 thin films
In the present report, we have prepared As 2 Se 3 and bilayer Ag/As 2 Se 3 chalcogenide
thin films prepared by thermal evaporation process. The top Ag layer is being diffused into …
thin films prepared by thermal evaporation process. The top Ag layer is being diffused into …
Effect of angle of deposition on micro-roughness parameters and optical properties of HfO2 thin films deposited by reactive electron beam evaporation
Oblique angle deposited oxide thin films, in which refractive index profiles can be tailored
across depth by tuning their microstructure using varying angle of deposition, have opened …
across depth by tuning their microstructure using varying angle of deposition, have opened …
Metallic to semiconducting transition and hydrophobicity properties of indium films
Abstract Indium films of thicknesses: 38–450 nm were deposited by thermal evaporation on
Si substrates by varying the angle of deposition from 0° to 75° and their structural, surface …
Si substrates by varying the angle of deposition from 0° to 75° and their structural, surface …
Annealing induced transformations in structural and optical properties of Ge30Se70− xBix thin films
ABSTRACT Thin films of Ge 30 Se 70− x Bi x (x= 5, 15, 20) were prepared by thermal
evaporation method on glass substrates with thickness 800 nm. The films were annealed at …
evaporation method on glass substrates with thickness 800 nm. The films were annealed at …
Oxygen partial pressure influenced stoichiometry, structural, electrical, and optical properties of DC reactive sputtered hafnium oxide films
S Venkataiah, SVJ Chandra… - Surface and …, 2021 - Wiley Online Library
HfO2 films have been deposited on quartz and p‐type Si (100) substrates using DC reactive
magnetron sputtering technique by sputtering of hafnium target at different oxygen partial …
magnetron sputtering technique by sputtering of hafnium target at different oxygen partial …
[PDF][PDF] Characterization of optical thin films by spectrophotometry and atomic force microscopy
The present article provides an overview of optical and morphological characterization of
optical thin films by using spectrophotometry and atomic force microscopy (AFM) …
optical thin films by using spectrophotometry and atomic force microscopy (AFM) …
Effect of silver, gold, and platinum substrates on structural and optical properties of tilted nanocolumnar SnS films
MM Shahidi, MH Ehsani… - Journal of Materials …, 2020 - Springer
Tin (II) sulfide films with tilted nanocolumns have been grown using thermal evaporation
method on silver, gold, and platinum substrates. A number of samples were prepared at …
method on silver, gold, and platinum substrates. A number of samples were prepared at …
Indentation modulus and microstructural properties of Zirconia–Alumina–Magnesia composite thin films deposited by electron beam evaporation under varying …
Abstract Zirconia-Alumina–Magnesia (ZrO 2 Al 2 O 3 MgO) ternary composite thin films are
used in the fabrication of interference multilayer thin film devices for lasers and photo …
used in the fabrication of interference multilayer thin film devices for lasers and photo …
Spectroscopic ellipsometry investigations of optical anisotropy in obliquely deposited hafnia thin films
In present work, HfO2 thin films have been deposited at various oblique incidences on Si
substrates by electron beam evaporation. These refractory oxide films exhibited anisotropy …
substrates by electron beam evaporation. These refractory oxide films exhibited anisotropy …