CDM Protection Test Structure for I/O Cells in a Submicronic Technology
MD Dobre, P Coll, G Brezeanu - Electronics, 2021 - mdpi.com
This paper proposes an investigation of a CDM (charge device model) electrostatic
discharge (ESD) protection method used in submicronic input–output (I/O) structures. The …
discharge (ESD) protection method used in submicronic input–output (I/O) structures. The …
Self-sufficient ESD Solution for Fail-safe I/O Design in FinFET Technology
HY Chen, TH Chang, KJ Chen… - 2024 46th Annual EOS …, 2024 - ieeexplore.ieee.org
A silicon validated novel snapback ESD design to provide self-sufficient ESD protection for
fail-safe I/O in FinFET technology is introduced. The self-sufficient ESD provides I/O to …
fail-safe I/O in FinFET technology is introduced. The self-sufficient ESD provides I/O to …