Study on Substrate Crack through Experiment and Simulation on SSD BGA under Temperature Cycling

W Yu, F Che, YC Ong, HW Ng - 2022 IEEE 24th Electronics …, 2022 - ieeexplore.ieee.org
This paper provides a comprehensive overview of typical substrate crack failure modes
under harsh temperature cycling test (TCT). Design features associated with substrate crack …

Effects of Thermal-Moisture Coupled Field on Delamination Behavior of Electronic Packaging

MK Shih, GS Lin, J Yang - Journal of …, 2024 - asmedigitalcollection.asme.org
Delamination failure is one of the most prevalent and serious reliability issues in micro-
electronic packaging. To understand this phenomenon further, this study constructs an …

Experimental and numerical investigation of delamination between epoxy molding compound (EMC) and metal in encapsulated microelectronic packages

MK Shih, YH Liu, GS Lin, E Hsu, J Yang - Experimental Techniques, 2024 - Springer
Microelectronics packages play a vital role in not only interconnecting the electronic signals
from the die to the printed circuit board (PCB), but also in protecting the chips during the …

Liquid metal/metal porous skeleton with high thermal conductivity and stable thermal reliability

L Tan, J Zhang, J Shen - Journal of Materials Science, 2023 - Springer
New thermal interface materials (TIM) with liquid metal (LM) as the main component show
many advantages in the field of thermal management. However, it is prone to leakage and …

Thermal Cycle Reliability of Copper Pillar Bumps in Advanced Fan-Out Packages

MK Shih, SJ Chen, IH Lin, BY Lou, T Ni - Journal of Electronic Materials, 2024 - Springer
Fan-out (FO) packages are in high demand for smartphones and Internet of Things (IoT)
devices because they allow for the integration of multiple components within a single …

High-Performance Flip-Chip BGA Packages Reliability Prediction in Automotive Applications

BH Chen, WH Lai, CL Kao, A Wang… - 2024 IEEE CPMT …, 2024 - ieeexplore.ieee.org
Recently, the demand of IC Packages has grown rapidly in automotive applications.
Advanced Driver Assistance Systems (ADAS) require more powerful and more chips to …

Electric Breakdown Mechanism of Build-up Films under High-Temperature and High-Humidity Conditions

J Yang, J Yu, H Huang, S Luo… - 2024 25th International …, 2024 - ieeexplore.ieee.org
Electronic products have been evolving towards high performance and high integration to
meet the demands of high-performance computing, next-generation mobile communication …

Electronic Packaging Interfacial Strength Measurement and Delamination Investigation

MK Shih, YH Liu, GS Lin, E Hsu… - … on Electronics Packaging …, 2023 - ieeexplore.ieee.org
The microelectronics package is not only interconnecting the electronic signals from die to
the printed circuit board (PCB), but also avoid the chips fracture during the manufacturing …

[引用][C] QFN 封裝在打線接合過程中之熱應力分析

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