MK Shih, GS Lin, J Yang - Journal of …, 2024 - asmedigitalcollection.asme.org
Delamination failure is one of the most prevalent and serious reliability issues in micro- electronic packaging. To understand this phenomenon further, this study constructs an …
MK Shih, YH Liu, GS Lin, E Hsu, J Yang - Experimental Techniques, 2024 - Springer
Microelectronics packages play a vital role in not only interconnecting the electronic signals from the die to the printed circuit board (PCB), but also in protecting the chips during the …
L Tan, J Zhang, J Shen - Journal of Materials Science, 2023 - Springer
New thermal interface materials (TIM) with liquid metal (LM) as the main component show many advantages in the field of thermal management. However, it is prone to leakage and …
MK Shih, SJ Chen, IH Lin, BY Lou, T Ni - Journal of Electronic Materials, 2024 - Springer
Fan-out (FO) packages are in high demand for smartphones and Internet of Things (IoT) devices because they allow for the integration of multiple components within a single …
Recently, the demand of IC Packages has grown rapidly in automotive applications. Advanced Driver Assistance Systems (ADAS) require more powerful and more chips to …
J Yang, J Yu, H Huang, S Luo… - 2024 25th International …, 2024 - ieeexplore.ieee.org
Electronic products have been evolving towards high performance and high integration to meet the demands of high-performance computing, next-generation mobile communication …
MK Shih, YH Liu, GS Lin, E Hsu… - … on Electronics Packaging …, 2023 - ieeexplore.ieee.org
The microelectronics package is not only interconnecting the electronic signals from die to the printed circuit board (PCB), but also avoid the chips fracture during the manufacturing …