Parametric models based on the adjoint field technique for RF passive integrated components

D Ioan, G Ciuprina… - IEEE transactions on …, 2008 - ieeexplore.ieee.org
Taking into consideration the variability specific to the nowadays nanotechnologies, the fast
extraction of parametric models is a must for the present VLSI and radio-frequency (RF) …

Adaptive meshing algorithm for recognition of material cracks

KM Gawrylczyk, P Putek - … journal for computation and mathematics in …, 2004 - emerald.com
Describes the algorithm allowing recognition of cracks and flaws placed on the surface of
conducting plate. The algorithm is based on sensitivity analysis in finite elements, which …

[PDF][PDF] Multi-frequency sensitivity analysis in FEM application for conductive materials flaw identification

KM Gawrylczyk, P Putek - ISEF, 2005 - researchgate.net
In the work the multi-frequency method of crack and flaw identification on the basis of
sensitivity analysis in FEM is shown. This inverse job consists in iterative Gauss-Newton …

Sensitivity analysis of electromagnetic quantities by means of FEM

KM Gawrylczyk - Journal of Technical Physics, 2002 - infona.pl
Sensitivity analysis determines the dependence of global or local electromagnetic quantities
on geometrical or physical parameters expressed in the form of an objective function. The …

Structure recognition of conductive materials utilizing FE-algorithms of non-destructive eddy-current testing

K Gawrylczyk, M Kugler - Pomiary Automatyka Kontrola, 2007 - yadda.icm.edu.pl
The paper deals with progress in electromagnetic methods used for structure evaluation of
conducting materials. The term" electromagnetic methods" covers the following areas …

[PDF][PDF] Electromagnetic methods in nondestructive testing of materials

KM Gawrylczyk - Facta universitatis-series: Electronics and …, 2003 - doiserbia.nb.rs
The article deals with progress in electromagnetic methods used for quality evaluation of
conducting materials. The term" electromagnetic methods" covers the following areas …

SENSITIVITY ANALYSIS OF ELECTROMAGNETIC QUANTITIES IN TIME DOMAIN

A Krawczyk, S Wiak - Electromagnetic Fields in Electrical …, 2002 - books.google.com
The final aim of field calculation methods is generally the design of an electromagnetic
device. Solving of inverse problem on the base of finite elements method provides useful …

[引用][C] The algorithm for recognition of subsurface cracks

KM Gawrylczyk - Compel, 2000 - Emerald Group Publishing, Limited