Influence of UV/Ozone Treatment on Threshold Voltage Modulation in Sol–Gel IGZO Thin‐Film Transistors

W Kim, WJ Lee, T Kwak, S Baek… - Advanced Materials …, 2022 - Wiley Online Library
Sol–gel indium–gallium–zinc oxide (IGZO) semiconductors are developed as active
components of thin‐film transistors (TFTs) because of their high electron mobility, cost …

Machine Learning Driven Channel Thickness Optimization in Dual‐Layer Oxide Thin‐Film Transistors for Advanced Electrical Performance

J Lee, JH Lee, C Lee, H Lee, M Jin, J Kim… - Advanced …, 2023 - Wiley Online Library
Abstract Machine learning (ML) provides temporal advantage and performance
improvement in practical electronic device design by adaptive learning. Herein, Bayesian …

IGZO TFT gate driver circuit with large threshold voltage margin

JH Kim, J Oh, KC Park, YS Kim - Displays, 2018 - Elsevier
This paper proposes a new gate driver circuit using depletion mode a-IGZO TFTs. The
proposed gate driver circuit can prevent Q node, the gate node of pull-up TFT, from …

Highly reliable bidirectional a-InGaZnO thin-film transistor gate driver circuit for high-resolution displays

CL Lin, CE Wu, FH Chen, PC Lai… - IEEE Transactions on …, 2016 - ieeexplore.ieee.org
This paper presents a new bidirectional gate driver circuit that utilizes amorphous indium–
gallium–zinc oxide thin-film transistors (TFTs). To ensure the compactness of the display …

IGZO TFT gate driver circuit with improved output pulse

JH Kim, J Oh, K Park, JH Jeon… - IEEE Journal of the …, 2018 - ieeexplore.ieee.org
We propose a new gate driver circuit with an improved output pulse using depletion mode
amorphous indium gallium zinc oxide thin film transistors. The previous reported gate driver …

Asymmetrical degradation behaviors in amorphous InGaZnO thin-film transistors under various gate and drain bias stresses

D Lee, CY Jeong, SH Song, J Xiao-Shi… - Journal of Vacuum …, 2015 - pubs.aip.org
The asymmetrical degradation behaviors of amorphous indium–gallium–zinc oxide thin-film
transistors are studied comprehensively under various gate and drain bias stresses. The …

Ultra-high-image-density, large-size organic light-emitting device panels based on highly reliable gate driver circuits integrated by using InGaZnO thin-film transistors

HJ Shin, TW Kim - IEEE Journal of the Electron Devices Society, 2019 - ieeexplore.ieee.org
Large-size, organic light-emitting device (OLED) panels based on highly reliable gate driver
circuits integrated using InGaZnO thin-film transistors (TFTs) were fabricated to achieve ultra …

Real-time external compensation of threshold voltage shift using double-gate oxide TFTs in a gate driving system

BH You, SY Lee, SH Hong, JH Lee… - Journal of Display …, 2016 - ieeexplore.ieee.org
In order to suppress the malfunction caused by the shift of the threshold voltage (VTH) of
oxide thin film transistors (TFTs) to a negative value, double-gate TFTs are used in the shift …

A low-power gate driver integrated by IZO-TFTs employing single negative power source

JW Chen, YF Hu, ZJ Chen, L Zhou… - Semiconductor …, 2018 - iopscience.iop.org
This paper proposes a new gate driver employing only a single negative power source,
which is integrated by In-Zn-O TFTs with an etch stop layer (ESL) structure. A negative …

P‐26: A low‐power gate driver using depletion‐mode a‐IGZO TFTs

CL Lin, YW Du, MH Cheng, YC Chen… - SID Symposium Digest …, 2014 - Wiley Online Library
A new gate driver composed of amorphous In‐Ga‐Zn‐O (a‐IGZO) thin‐film transistors (TFTs)
is proposed. By turning off TFTs completely to suppress the leakage current and eliminating …