With the development of microwave chips toward high integration, new challenges have
been posed to high-precision microwave field test techniques. In this article, we propose a …

Quantitative determination of the dielectric property is important to the analysis and
evaluation of the investigated samples' performance. This article proposes a physics …

A general approach for calculating tip-sample capacitance variation in near-field scanning
microwave microscopy is presented. It can be applied to arbitrary tip shapes, thick and thin …

A three-dimensional finite element numerical modeling for the scanning microwave
microscopy (SMM) setup is applied to study the full-wave quantification of the local material …

Accurate characterization of sample dielectric property is essential for scientists and
engineers to analyze and evaluate the performance of the invested sample. This article …

We demonstrate the ability of the scanning microwave microscope (SMM) to detect
subsurface metal lines embedded in a dielectric film with sub-micrometer resolution. The …

Strain distribution is an important indicator of stress concentration, damage initiation and
evolution. Many dielectric materials sustain very large strain before failure. In this paper, a …

A scalable multiple-probe near-field sensing technique using coupled resonators is
presented. The technique captures perturbation information about metal scatterers near …

This article utilizes the spectral analysis method to investigate the influence of 2-D
transceiver array aperture size and polarization on 3-D qualitative microwave imaging of …

This article presents a 2-D near-field sensing technique using single-port (reflection-type)
coupled-resonator probe arrays. It utilizes the frequency diversity exhibited by a single-port …