Trivalent Atom Defect-Complex Induced Defect Levels in Germanium for Enhanced Ge‑Based Device Performance

E Igumbor, M Dongho-Nguimdo, E Mapasha… - Journal of Electronic …, 2024 - Springer
Defect complexes have a significant impact on the structural, electronic, optical and
electrical properties of semiconductors. Several defect complexes formed by n-type and p …

Exploring defect engineering in monolayer TiS3 for next-generation electronic devices: Insights from first-principles study

GM Dongho-Nguimdo, E Igumbor, EM Benecha… - Computational …, 2024 - Elsevier
Titanium trisulfide monolayer (TiS 3) is a quasi-1D crystal with promising applications in a
range of fields, including photoelectrochemical cells and thermoelectrics. Despite the …

Electronic properties and defect levels induced by n/p-type defect-complexes in Ge

E Igumbor, O Olaniyan, GM Dongho-Nguimdo… - Materials Science in …, 2022 - Elsevier
Defect-complexes are point defects that significantly influence the geometric, optical, and
electrical properties of materials. Defect-complexes are known to improve the electronic and …

Hybrid functional study of hydrogen passivation in carbon-oxygen related defect complexes in silicon

A Abdurrazaq, WE Meyer - Physica B: Condensed Matter, 2019 - Elsevier
Density functional theory (DFT) with the Heyd-Scuseria-Ernzerhof hybrid functional was
used to predict the structure, formation energy, stability and the charge state transition …

Stability, electronic and defect levels induced by substitution of Al and P pair in 4H–SiC

E Igumbor, GM Dongho-Nguimdo, RE Mapasha… - Journal of Physics and …, 2020 - Elsevier
Impurities play a major role in identifying the most enhanced defect-levels induced in 4H–
SiC. Among the important n-and p-type dopants in SiC are the P and Al, respectively. The P …

Electrically active induced energy levels and metastability of B and N vacancy-complexes in 4H–SiC

E Igumbor, O Olaniyan, RE Mapasha… - Journal of Physics …, 2018 - iopscience.iop.org
Electrically active induced energy levels in semiconductor devices could be beneficial to the
discovery of an enhanced p or n-type semiconductor. Nitrogen (N) implanted into 4H–SiC is …

Rare earth interstitial-complexes in Ge: hybrid density functional studies

E Igumbor, E Omotoso, HT Danga, SM Tunhuma… - Nuclear Instruments and …, 2017 - Elsevier
We present results of the structural, energetic and electronic properties of rare earth (RE)
interstitial-complexes in Ge (RE Ge Ge i; for RE: Ce, Pr, Eu, Er and Tm). We used the Heyd …

Defect levels induced by double substitution of B and N in 4H-SiC

E Igumbor, HT Danga, E Omotoso, WE Meyer - Nuclear Instruments and …, 2019 - Elsevier
Studies of substitutional impurities in 4H-SiC play a major role in identifying the most
enhanced defect levels induced. N and B substitution in 4H-SiC on separate studies reveal …

[引用][C] STUDY OF GROUP II IMPURITIES AND STABILITY OF DEFECT-COMPLEXES IN GERMANIUM

E Igumbor, BE Iyare, FA Popoola, M Achurefe - SAU Science-Tech Journal, 2022