Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a technique designed to
analyze the composition and spatial distribution of molecules and chemical structures on …

Hydrocarbon oligomers, high-molecular-weight polymers, and polymer additives have been
covered with 2− 60 nmol of gold/cm2 in order to enhance the ionization efficiency for static …

The metallization procedure, proposed recently for signal improvement in organic secondary
ion mass spectrometry (SIMS)(Delcorte, A.; Médard, N.; Bertrand, P. Anal. Chem. 2002, 74 …

This article reviews the recent progress in the understanding of kiloelectronvolt particle
interactions with organic solids, including atomic displacements in a light organic medium …

The enhancement of the static secondary ion mass spectrometry (SIMS) signals resulting
from the injection, closely to the sample surface, of H2O vapor at relatively high-pressure …

Transferring large nonvolatile molecules in the vacuum is key to both their characterization
by mass spectrometry (ion mobility, etc.) and their use as nanofabrication building blocks in …

In a search for molecular ion signal enhancement in organic SIMS, the efficiency of a series
of organic and inorganic salts for molecular cationization has been tested using a panel of …

A model is presented in which electron impact (EI)/electronic excitation plays a pivotal role in
the formation of secondary ions in the SIMS experiment, especially those originating from …

Electrospray droplet impact (EDI)/secondary ion mass spectrometry (SIMS) is a new
desorption/ionization technique for mass spectrometry in which highly charged water …

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is one of the most powerful
techniques for the analysis of ultrathin substances on material surfaces, owing to its surface …