Fully vertical GaN pin diodes using GaN-on-Si epilayers

X Zou, X Zhang, X Lu, CW Tang… - IEEE Electron Device …, 2016 - ieeexplore.ieee.org
Using GaN-on-Si epilayers, for the first time, fully vertical pin diodes are demonstrated after
Si substrate removal, transfer, and n-electrode formation at the top of the device. After SiO 2 …

High voltage vertical GaN pn diodes with hydrogen-plasma based guard rings

H Fu, K Fu, SR Alugubelli, CY Cheng… - IEEE Electron …, 2019 - ieeexplore.ieee.org
This letter demonstrates novel hydrogen-plasma based guard rings (GRs) for high voltage
vertical GaN pn diodes grown on bulk GaN substrates by metalorganic chemical vapor …

820-V GaN-on-Si quasi-vertical pin diodes with BFOM of 2.0 GW/cm2

RA Khadar, C Liu, L Zhang, P Xiang… - IEEE Electron …, 2018 - ieeexplore.ieee.org
In this letter, we demonstrate GaN-on-Si pin diodes with high breakdown voltage and state-
of-the-art Baliga's figure of merit (BFOM) among GaN-on-Si vertical devices. The growth and …

1.1-kV vertical GaN pn diodes with p-GaN regrown by molecular beam epitaxy

Z Hu, K Nomoto, M Qi, W Li, M Zhu… - IEEE Electron …, 2017 - ieeexplore.ieee.org
High-voltage vertical regrown pn junction diodes on bulk GaN substrates are reported in this
letter with molecular-beam-epitaxy regrown p-GaN on metalorganic-chemical-vapor …

Fully-and quasi-vertical GaN-on-Si pin diodes: High performance and comprehensive comparison

X Zhang, X Zou, X Lu, CW Tang… - IEEE Transactions on …, 2017 - ieeexplore.ieee.org
We report growth and fabrication of fully-and quasi-vertical GaN-on-Si pin diodes. A record
high Baliga figure of merit of 304 and 152 MW/cm 2 is reported for fully-and quasi-vertical …

Breakdown ruggedness of quasi-vertical GaN-based pin diodes on Si substrates

X Zou, X Zhang, X Lu, CW Tang… - IEEE Electron Device …, 2016 - ieeexplore.ieee.org
This letter reports the breakdown ruggedness of GaN-based quasi-vertical pin diodes on Si
for the first time. With a 2μm-thick drift layer, the 0.08-mm 2 devices can sustain a surge …

Suppression of current leakage along mesa surfaces in GaN-based pin diodes

BS Zheng, PY Chen, CJ Yu, YF Chang… - IEEE Electron …, 2015 - ieeexplore.ieee.org
Trifluoromethane-containing plasma is used to passivate the mesa surfaces and suppresses
the surface leakage current of GaN pin rectifiers. Reduction of surface leakage enhances the …

Temperature-dependent characteristics of GaN homojunction rectifiers

TT Kao, J Kim, YC Lee, AFMS Haq… - … on Electron Devices, 2015 - ieeexplore.ieee.org
We report a homojunction gallium nitride (GaN) pin rectifier fabricated on free-standing GaN
substrates with the breakdown voltage 800 V and low specific ON-resistance (R ON A). At …

Using two-step mesa to prevent the effects of sidewall defects on the GaN pin diodes

YF Chang, CL Liao, BS Zheng, JZ Liu… - IEEE Journal of …, 2015 - ieeexplore.ieee.org
In this paper, the two-step mesas of quasi-vertical GaN pin diodes grown on pattern
sapphire substrates (PSSs) with a 3-μm i-layer were defined by two-step dry etching to …

Steady State and Transient Thermal Characterization of Vertical GaN PIN Diodes

G Pavlidis, J Dallas, S Choi… - International …, 2017 - asmedigitalcollection.asme.org
In this work, we investigate the thermal response of GaN PIN diodes grown on a sapphire
substrate and compare the results to GaN PIN diodes grown on a free standing GaN …