A review on chemical and mechanical phenomena at the wafer interface during chemical mechanical planarization

J Seo - Journal of Materials Research, 2021 - Springer
As the minimum feature size of integrated circuit elements has shrunk below 7 nm, chemical
mechanical planarization (CMP) technology has grown by leaps and bounds over the past …

Mechanical aspects of the chemical mechanical polishing process: A review

H Lee, D Lee, H Jeong - International journal of precision engineering and …, 2016 - Springer
Chemical mechanical polishing (CMP) is an essential semiconductor manufacturing process
because of its local and global planarization ability in fabricating highly integrated devices …

A novel hypergraph convolution network-based approach for predicting the material removal rate in chemical mechanical planarization

L Xia, P Zheng, X Huang, C Liu - Journal of Intelligent Manufacturing, 2022 - Springer
The material removal rate (MRR) plays a critical role in the chemical mechanical
planarization (CMP) process in the semiconductor industry. Many physics-based and data …

Modeling the microscale contact status in chemical mechanical polishing process

L Wang, P Zhou, Y Yan, D Guo - International Journal of Mechanical …, 2022 - Elsevier
The micro-scale contact status between pad and workpiece surface plays one of the most
significant roles in determining the material removal rate (MRR) during the chemical …

Doping strategy on properties and chemical mechanical polishing performance of CeO2 Abrasives: A DFT assisted experimental study

J Ma, N Xu, J Hu, Y Luo, Y Lin, Y Pu - Applied Surface Science, 2023 - Elsevier
A series of Ce 1-x M x O 2 abrasives with different types and amounts of doping were
prepared by molten salt method. The properties of abrasives were characterized in detail by …

From design for manufacturing (DFM) to manufacturing for design (MFD) via hybrid manufacturing and smart factory: A review and perspective of paradigm shift

WS Chu, MS Kim, KH Jang, JH Song… - International Journal of …, 2016 - Springer
Manufacturing paradigms have historically been shaped by social, economic, and
technological aspect, including limitations and needs. Design for manufacturing (DFM) has …

Meso-silica/Erbium-doped ceria binary particles as functionalized abrasives for photochemical mechanical polishing (PCMP)

A Chen, Y Duan, Z Mu, W Cai, Y Chen - Applied Surface Science, 2021 - Elsevier
We report the design and synthesis of meso-silica/ceria binary composite particles and their
usage as functionalized abrasives for photochemical mechanical polishing (PCMP). Meso …

Micromanufacturing: a review—part I

VK Jain, A Sidpara… - Proceedings of the …, 2014 - journals.sagepub.com
Micromanufacturing processes are expanding in their length and breadth as long as the
related research and development (R&D) activities and applications are concerned …

Prediction of material removal rate for chemical mechanical planarization using decision tree-based ensemble learning

Z Li, D Wu, T Yu - Journal of Manufacturing Science …, 2019 - asmedigitalcollection.asme.org
Chemical mechanical planarization (CMP) has been widely used in the semiconductor
industry to create planar surfaces with a combination of chemical and mechanical forces. A …

Theoretical and experimental investigation of chemical mechanical polishing of W–Ni–Fe alloy

J Guo, X Shi, C Song, L Niu, H Cui, X Guo… - … Journal of Extreme …, 2021 - iopscience.iop.org
Fine finishing of tungsten alloy is required to improve the surface quality of molds and
precision instruments. Nevertheless, it is difficult to obtain high-quality surfaces as a result of …