A suite of IEEE 1687 benchmark networks
The saturation of the IJTAG concept and its approval as the IEEE 1687 standard in 2014 has
generated a wave of research activities and created demand for a set of appropriate and …
generated a wave of research activities and created demand for a set of appropriate and …
Optimization-based test scheduling for IEEE 1687 multi-power domain networks using Boolean satisfiability
The IEEE 1687 Std. provides an efficient access methodology for embedded instruments in
complex system-on-a-chip designs by introducing reconfigurable scan networks. This …
complex system-on-a-chip designs by introducing reconfigurable scan networks. This …
Power-aware test scheduling framework for IEEE 1687 multi-power domain networks using formal techniques
Abstract The IEEE 1687 Std.(IJTAG) introduces an efficient access methodology based on
reconfigurable scan networks to address the ever-increasing complexity of the latest system …
reconfigurable scan networks to address the ever-increasing complexity of the latest system …
Power-aware test scheduling for IEEE 1687 networks with multiple power domains
New test access methodologies are required to cope with the ever-increasing complexity of
latest system-on-a-chip designs. The IEEE 1687 standard defines an access methodology to …
latest system-on-a-chip designs. The IEEE 1687 standard defines an access methodology to …
Efficient pruning of search trees in LQR control of switched linear systems
B Lincoln, B Bernhardsson - … of the 39th IEEE Conference on …, 2000 - ieeexplore.ieee.org
Considers off-line optimization of a switching sequence for a given finite set of linear control
systems and joint optimization of control laws. A linear quadratic full information criterion is …
systems and joint optimization of control laws. A linear quadratic full information criterion is …
Test time minimization in reconfigurable scan networks
Modern devices often include several embedded instruments, such as BISTs, sensors, and
other analog components. New standards, such as IEEE Std. 1687, provide vehicles to …
other analog components. New standards, such as IEEE Std. 1687, provide vehicles to …
Broadcast-based minimization of the overall access time for the IEEE 1687 network
Z Zhong, G Li, Q Yang, J Qian… - 2018 IEEE 36th VLSI …, 2018 - ieeexplore.ieee.org
The IEEE Std. 1687 enables flexible access to on-chip instruments through the JTAG test-
access port. This flexibility enables the minimization of the overall access time (OAT), and a …
access port. This flexibility enables the minimization of the overall access time (OAT), and a …
Structure-oriented test of reconfigurable scan networks
D Ull, M Kochte, HJ Wunderlich - 2017 IEEE 26th Asian Test …, 2017 - ieeexplore.ieee.org
Design, production and operation of modern system-on-chips rely on integrated instruments,
which range from simple sensors to complex debug interfaces and design-for-test (DfT) …
which range from simple sensors to complex debug interfaces and design-for-test (DfT) …
A novel test generation and application flow for functional access to IEEE 1687 instruments
M Portolan - 2016 21th IEEE European test symposium (ETS), 2016 - ieeexplore.ieee.org
The new IEEE 1687 standard provides important novelties, such as dynamic topology and
access to deeply embedded instruments. Unfortunately, traditional tool flows are not able to …
access to deeply embedded instruments. Unfortunately, traditional tool flows are not able to …
Optimization of the IEEE 1687 access network for hybrid access schedules
SS Nuthakki, R Karmakar… - 2016 IEEE 34th VLSI …, 2016 - ieeexplore.ieee.org
The IEEE 1687 Standard specifies an access network and a description language for
embedded instruments. In this paper, we present an optimization technique to minimize the …
embedded instruments. In this paper, we present an optimization technique to minimize the …