State of the art and future perspectives in advanced CMOS technology

HH Radamson, H Zhu, Z Wu, X He, H Lin, J Liu… - Nanomaterials, 2020 - mdpi.com
The international technology roadmap of semiconductors (ITRS) is approaching the
historical end point and we observe that the semiconductor industry is driving …

A review of InP/InAlAs/InGaAs based transistors for high frequency applications

J Ajayan, D Nirmal - Superlattices and Microstructures, 2015 - Elsevier
This paper presents an overview of the rapid progress being made in the development of
InP based devices for high speed applications. Over the past few decades, major aero …

A native oxide high-κ gate dielectric for two-dimensional electronics

T Li, T Tu, Y Sun, H Fu, J Yu, L Xing, Z Wang… - Nature …, 2020 - nature.com
Silicon-based transistors are approaching their physical limits and thus new high-mobility
semiconductors are sought to replace silicon in the microelectronics industry. Both bulk …

A review of silicon-based wafer bonding processes, an approach to realize the monolithic integration of Si-CMOS and III–V-on-Si wafers

S Bao, Y Wang, K Lina, L Zhang, B Wang… - Journal of …, 2021 - iopscience.iop.org
The heterogeneous integration of III–V devices with Si-CMOS on a common Si platform has
shown great promise in the new generations of electrical and optical systems for novel …

Almost perfectly symmetric SWCNT-based CMOS devices and scaling

Z Zhang, S Wang, Z Wang, L Ding, T Pei, Z Hu… - Acs Nano, 2009 - ACS Publications
Symmetric n-and p-type field-effect transistors (FETs) have been fabricated on the same
undoped single-walled carbon nanotube (SWCNT). The polarity of the FET is defined by …

Effects of (NH4) 2S passivation on the off-state performance of 3-dimensional InGaAs metal-oxide-semiconductor field-effect transistors

JJ Gu, AT Neal, PD Ye - Applied Physics Letters, 2011 - pubs.aip.org
Planar and 3-dimensional (3D) buried-channel InGaAs metal-oxide-semiconductor field-
effect transistors (MOSFETs) have been experimentally demonstrated at deep-submicron …

[HTML][HTML] Growth and characterization of germanium epitaxial film on silicon (001) with germane precursor in metal organic chemical vapour deposition (MOCVD) …

KH Lee, A Jandl, YH Tan, EA Fitzgerald, CS Tan - Aip Advances, 2013 - pubs.aip.org
The quality of germanium (Ge) epitaxial film grown directly on a silicon (Si)(001) substrate
with 6 off-cut using conventional germane precursor in a metal organic chemical vapour …

Numerical evaluation of the effect of geometric tolerances on the high-frequency performance of graphene field-effect transistors

M La Mura, P Lamberti, V Tucci - Nanomaterials, 2021 - mdpi.com
The interest in graphene-based electronics is due to graphene's great carrier mobility,
atomic thickness, resistance to radiation, and tolerance to extreme temperatures. These …

On the physical behavior of cryogenic IV and III–V Schottky barrier MOSFET devices

M Schwarz, LE Calvet, JP Snyder… - … on Electron Devices, 2017 - ieeexplore.ieee.org
The physical influence of temperature down to the cryogenic regime is analyzed in a
comprehensive study and the comparison of IV and III-V Schottky barrier (SB) double-gate …

Sub-50-nm MOSFETs With Various Barrier Layer Materials

F Xue, A Jiang, H Zhao, YT Chen… - IEEE electron device …, 2011 - ieeexplore.ieee.org
Sub-50-nm In_0.7Ga_0.3As MOSFETs with high-k dielectric Al_2O_3 have been
demonstrated and investigated. The device performance of buried-channel In_0.7Ga_0.3As …