Leakage current in a MOS device has become a bottleneck with the technological growth of semiconductor industry. As the device is scaled down to sub nano meter regime, leakage …
C Sahu, J Singh - IEEE Electron device letters, 2014 - ieeexplore.ieee.org
In this letter, we report for the first time a distinctive approach of implementing a junctionless transistor (JLT) without doping (doping-less) the ultrathin silicon film. A charge-plasma …
We study theoretically the low-energy hole states in Si, Ge, and Ge/Si core/shell nanowires (NWs). The NW core in our model has a rectangular cross section, the results for a square …
Abstract Tri-Gate (TG) FinFETs are the most reliable option to get into deeply scaled gate lengths. This paper analyses an optimized 5 nm gate length (LG) n-channel TG Junctionless …
Silicon (Si) ultrathin junctionless (JL) n-FinFET with LG= 3 nm and 1 nm are explored for the first time by invoking Hf x Ti 1-x O 2 based high-k gate dielectric. The 3D device performance …
This work covers the impact of dual metal gate engineered Junctionless MOSFET with various high-k dielectric in Nanoscale circuits for low power applications. Due to gate …
A Gnudi, S Reggiani, E Gnani… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
A 2-D semianalytical solution for the electrostatic potential valid for junctionless symmetric double-gate field-effect transistors in subthreshold regime is proposed, which is based on …
In this paper, for the first time, we have investigated the DC and analog/RF performance metrics of 3 nm gate length (LG) silicon-on-insulator (SOI) FinFET using Hf x Ti 1− x O 2 high …
N Vadthiya - ECS journal of solid state science and technology, 2021 - iopscience.iop.org
In this paper, we have studied the impact of various dielectric single-k (Sk) and dual-k (Dk) spacers on optimized Junctionless (JL) FinFET at nano-regime by using hetero-dielectric …