MC Raval, A Joshi, CS Solanki - 2013 IEEE 39th Photovoltaic …, 2013 - ieeexplore.ieee.org
Ni-Cu based front contacts for c-Si cells are plated on patterned SiN x and there could be undesirable background plating leading to shading and shunting losses. In this work …
We report on the investigation of Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP AES), a trace element analysis technique, as a bulk impurity characterization and …