Three-dimensional integrated circuit design

Y Xie, J Cong, S Sapatnekar - EDA, Design and Microarchitectures, New …, 2010 - Springer
To the observer, it would appear that New York city has a special place in the hearts of
integrated circuit (IC) designers. Manhattan geometries, which mimic the blocks and streets …

Yield enhancement for 3D-stacked ICs: Recent advances and challenges

Q Xu, L Jiang, H Li, B Eklow - 17th Asia and South Pacific …, 2012 - ieeexplore.ieee.org
Three-dimensional (3D) integrated circuits (ICs) that stack multiple dies vertically using
through-silicon vias (TSVs) have gained wide interests of the semiconductor industry. The …

TSV-based 3-D ICs: Design methods and tools

T Lu, C Serafy, Z Yang, SK Samal… - … on Computer-Aided …, 2017 - ieeexplore.ieee.org
Vertically integrated circuits (3-D ICs) may revitalize Moore's law scaling which has slowed
down in recent years. 3-D stacking is an emerging technology that stacks multiple dies …

Comparing through-silicon-via (TSV) void/pinhole defect self-test methods

Y Lou, Z Yan, F Zhang, PD Franzon - Journal of Electronic Testing, 2012 - Springer
Three methods have been proposed to test Through-Silicon-Vias (TSV) electrically prior to
3D integration. These test methods are (1) sense amplification;(2) leakage current monitor; …

Clock tree synthesis for low cost pre-bond testing of 3D integrated circuits

SK Lim, K Samadi, P Kamal, Y Du - US Patent 9,508,615, 2016 - Google Patents
To enable low cost pre-bond testing for a three-dimensional (3D) integrated circuit, a
backbone die may have a fully connected two-dimensional (2D) clock tree and one or more …

Resonant clock synchronization with active silicon interposer for multi-die systems

R Kuttappa, B Taskin, S Lerner… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
This paper presents the integration of resonant clocking to multi-die architectures to
synchronize individual chiplets connected through an active silicon interposer. The …

Clock tree synthesis for TSV-based 3D IC designs

TY Kim, T Kim - ACM Transactions on Design Automation of Electronic …, 2011 - dl.acm.org
For the cost-effective implementation of clock trees in through-silicon via (TSV)-based 3D IC
designs, we propose core algorithms for 3D clock tree synthesis. For a given abstract tree …

Through-silicon via fault-tolerant clock networks for 3-D ICs

CL Lung, YS Su, HH Huang, Y Shi… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
Clock network synthesis is one of the most important and challenging problems in 3-D ICs.
The clock signals have to be delivered by through-silicon vias (TSVs) to different tiers with …

Fault-tolerant 3D clock network

CL Lung, YS Su, SH Huang, Y Shi… - Proceedings of the 48th …, 2011 - dl.acm.org
Clock tree synthesis is one of the most important and challenging problems in 3D ICs. The
clock signals have to be delivered by through-silicon vias (TSVs) to different tiers with …

Fault-tolerant unit and method for through-silicon via

CL Lung, YS Su, SC Chang, Y Shi - US Patent 9,177,940, 2015 - Google Patents
(57) ABSTRACT A fault-tolerant unit and a fault-tolerant method for through silicon via (TSV)
are provided. The fault-tolerant unit includes TSV structures TSV1-TSVn, nodes N1-N1 …