Structural properties of self-organized semiconductor nanostructures

J Stangl, V Holý, G Bauer - Reviews of modern physics, 2004 - APS
Instabilities in semiconductor heterostructure growth can be exploited for the self-organized
formation of nanostructures, allowing for carrier confinement in all three spatial dimensions …

Ge dots and nanostructures grown epitaxially on Si

JM Baribeau, X Wu, NL Rowell… - Journal of Physics …, 2006 - iopscience.iop.org
We review recent progress in the growth and characterization of Si 1− x Ge x islands and Ge
dots on (001) Si. We discuss the evolution of the island morphology with Si 1− x Ge x …

Germanium based photonic components toward a full silicon/germanium photonic platform

V Reboud, A Gassenq, JM Hartmann, J Widiez… - Progress in Crystal …, 2017 - Elsevier
Lately, germanium based materials attract a lot of interest as they can overcome some limits
inherent to standard Silicon Photonics devices and can be used notably in Mid-Infra-Red …

Raman spectroscopy determination of composition and strain in Si1-xGex/Si heterostructures

F Pezzoli, E Bonera, E Grilli, M Guzzi… - Materials science in …, 2008 - Elsevier
A procedure for the quantitative measurement of composition and strain in epitaxial Si1-
xGex/Si heterostructures by means of Raman spectroscopy for any Ge concentration is …

Analysis of strain and intermixing in single-layer quantum dots using polarized Raman spectroscopy

AV Baranov, AV Fedorov, TS Perova, RA Moore… - Physical Review B …, 2006 - APS
The built-in strain and composition of as-grown and Si-capped single layers of Ge∕ Si dots
grown at various temperatures (460–800° C) are studied by a comparative analysis of the …

Accurate strain measurements in highly strained Ge microbridges

A Gassenq, S Tardif, K Guilloy, G Osvaldo Dias… - Applied Physics …, 2016 - pubs.aip.org
Ge under high strain is predicted to become a direct bandgap semiconductor. Very large
deformations can be introduced using microbridge devices. However, at the microscale …

Phonon strain shift coefficients in Si1− xGex alloys

F Pezzoli, E Bonera, E Grilli, M Guzzi… - Journal of Applied …, 2008 - pubs.aip.org
A comprehensive study of the biaxial strain-induced shift of the Si 1− x Ge x Raman active
phonon modes is presented. High-resolution Raman measurements of Si 1− x Ge x/Si …

The influence of low-temperature Ge seed layer on growth of high-quality Ge epilayer on Si (1 0 0) by ultrahigh vacuum chemical vapor deposition

Z Zhou, C Li, H Lai, S Chen, J Yu - Journal of Crystal Growth, 2008 - Elsevier
High-quality Ge epilayer on Si (100) substrate with an inserted low-temperature Ge seed
layer and a thin Si0. 77Ge0. 23 layer was grown by ultrahigh vacuum chemical vapor …

Enhancing the Seebeck effect in Ge/Si through the combination of interfacial design features

A Nadtochiy, V Kuryliuk, V Strelchuk, O Korotchenkov… - Scientific reports, 2019 - nature.com
Due to their inherent physical properties, thin-film Si/SiGe heterostructures have specific
thermal management applications in advanced integrated circuits and this in turn is …

Broadband 400-2400 nm Ge heterostructure nanowire photodetector fabricated by three-dimensional Ge condensation technique

G Lin, D Liang, C Yu, H Hong, Y Mao, C Li, S Chen - Optics Express, 2019 - opg.optica.org
A 2.7% tensile strained Ge/SiGe heterostructure nanowire (NW) is in-situ fabricated by a
three-dimensional Ge condensation method. The NW metal-semiconductor-metal (MSM) …