[HTML][HTML] Prospects for SiC electronics and sensors

NG Wright, AB Horsfall, K Vassilevski - Materials today, 2008 - Elsevier
There has been substantial international research effort in the development of SiC
electronics over the last ten years. With promising applications in power electronics, hostile …

SiC power Schottky and PiN diodes

R Singh, JA Cooper, MR Melloch… - … on Electron Devices, 2002 - ieeexplore.ieee.org
The present state of SiC power Schottky and PiN diodes are presented in this paper. The
design, fabrication, and characterization of a 130 A Schottky diode, 4.9 kV Schottky diode …

[图书][B] SiC materials and devices

M Shur, SL Rumyantsev - 2006 - books.google.com
After many years of research and development, silicon carbide has emerged as one of the
most important wide band gap semiconductors. The first commercial SiC devices? power …

Recent progress and current issues in SiC semiconductor devices for power applications

CM Johnson, NG Wright, MJ Uren, KP Hilton… - IEE Proceedings-Circuits …, 2001 - IET
A review of current issues in SiC device processing technology is followed by a critical
assessment of the current state-of-the-art and future potential for SiC power devices …

" Paradoxes" of carrier lifetime measurements in high-voltage SiC diodes

ME Levinshtein, TT Mnatsakanov… - … on Electron Devices, 2001 - ieeexplore.ieee.org
For Silicon Carbide (SiC) high-voltage rectifier diodes, contradictions appear when the most
important parameter of the diodes, the minority carrier lifetime, is measured by different …

High-voltage mesa-structure GaN Schottky rectifiers processed by dry and wet etching

TG Zhu, DJH Lambert, BS Shelton, MM Wong… - Applied Physics …, 2000 - pubs.aip.org
We have fabricated and investigated high-voltage GaN vertical Schottky-barrier rectifiers
grown by metalorganic chemical vapor deposition. A mesageometry Schottky-barrier rectifier …

Design of edge termination for GaN power Schottky diodes

JR Laroche, F Ren, KW Baik, SJ Pearton… - Journal of Electronic …, 2005 - Springer
Abstract The GaN Schottky diodes capable of operating in the 300–700-V range with low
turn-on voltage (0.7 V) and forward conduction currents of at least 10 A at 1.4 V (with …

Semiempirical model of carrier mobility in silicon carbide for analyzing its dependence on temperature and doping level

TT Mnatsakanov, LI Pomortseva, SN Yurkov - Semiconductors, 2001 - Springer
Experimental data on electron and hole mobility in three silicon carbide polytypes, 4 H-SiC,
6 H-SiC, and 3 C-SiC, are analyzed. A semiempirical model is proposed for describing the …

An analytical model of the forward I–V characteristics of 4H-SiC pin diodes valid for a wide range of temperature and current

S Bellone, FG Della Corte, LF Albanese… - IEEE transactions on …, 2011 - ieeexplore.ieee.org
The forward I–V characteristics of 4H-SiC pin diodes are studied in a wide range of currents
and temperatures by means of an analytical model that allows us to highlight the minority …

Analytical and numerical studies of p+-emitters in silicon carbide bipolar devices

ME Levinshtein, TT Mnatsakanov… - Semiconductor …, 2011 - iopscience.iop.org
In this paper, ways to create silicon carbide p+-emitters with high injection coefficients are
considered. Raising the emitter doping level, eliminating the deteriorated layer, and making …