Overview of real-time lifetime prediction and extension for SiC power converters

Z Ni, X Lyu, OP Yadav, BN Singh… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
Remaining useful lifetime prediction and extension of Si power devices have been studied
extensively. Silicon carbide (SiC) power devices have been developed and commercialized …

A comprehensive review toward the state-of-the-art in failure and lifetime predictions of power electronic devices

A Hanif, Y Yu, D DeVoto, F Khan - IEEE Transactions on Power …, 2018 - ieeexplore.ieee.org
This paper discusses various types of failure mechanisms, precursor parameters, and
accelerated aging-based procedures to estimate the remaining life of power electronic …

Study and handling methods of power IGBT module failures in power electronic converter systems

UM Choi, F Blaabjerg, KB Lee - IEEE Transactions on Power …, 2014 - ieeexplore.ieee.org
Power electronics plays an important role in a wide range of applications in order to achieve
high efficiency and performance. Increasing efforts are being made to improve the reliability …

A lifetime estimation technique for voltage source inverters

H Huang, PA Mawby - IEEE Transactions on Power Electronics, 2012 - ieeexplore.ieee.org
This paper presents a method to estimate the inverter lifetime so that we can predict a failure
prior to it actually happening. The key contribution of this study is to link the physics of the …

Reliability of wide band gap power electronic semiconductor and packaging: A review

Y Wang, Y Ding, Y Yin - Energies, 2022 - mdpi.com
Wide band gap (WBG) power electronic devices, such as silicon carbide metal–oxide–
semiconductor field-effect transistors (SiC MOSFETs) and gallium–nitride high-electron …

Recent advances on kinetic analysis of solder joint reactions in 3D IC packaging technology

KN Tu, Y Liu - Materials Science and Engineering: R: Reports, 2019 - Elsevier
We review five solder joint reactions in 3D IC packaging technology which are of wide
interest:(1) Scallop-type growth of Cu 6 Sn 5 in solid-liquid interdiffusion reaction,(2) Whisker …

Failure and reliability analysis of a SiC power module based on stress comparison to a Si device

B Hu, JO Gonzalez, L Ran, H Ren… - … on device and …, 2017 - ieeexplore.ieee.org
The superior electro-thermal properties of silicon carbide (SiC) power devices permit higher
temperature of operation and enable higher power density compared with silicon devices …

Accumulated creep strain and energy density based thermal fatigue life prediction models for SnAgCu solder joints

A Syed - 2004 Proceedings. 54th electronic components and …, 2004 - ieeexplore.ieee.org
Pb free solder is fast becoming a reality in electronic manufacturing due to marketing and
legislative pressures. The industry has pretty much concluded that various versions of …

New physical model for lifetime estimation of power modules

IF Kovačević, U Drofenik… - The 2010 International …, 2010 - ieeexplore.ieee.org
In this paper a physical model for lifetime estimation of standard power modules is
proposed. The lifetime prediction is based on the assumption that the solder …

Unveiling the damage evolution of SAC305 during fatigue by entropy generation

X Long, Y Guo, Y Su, KS Siow, C Chen - International Journal of …, 2023 - Elsevier
Low-cycle thermal-mechanical fatigue loadings induce progressive and permanent
degradation of mechanical properties of lead-free solder materials, and thus reduce the …