This book is a comprehensive guide to new DFT methods that will show the readers how to
design a testable and quality product, drive down test cost, improve product quality and …

This paper presents a novel test-data volume-compression methodology called the
embedded deterministic test (EDT), which reduces manufacturing test cost by providing one …

Test data compression consists of test vector compression on the input side and response,
compaction on the output side. This vector compression has been an active area of …

Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

Databases are at the core of successful businesses. Due to the voluminous stores of
personal data being held by companies today, preserving privacy has become a crucial …

Selective Huffman coding has recently been proposed for efficient test-data compression
with low hardware overhead. In this paper, we show that the already proposed encoding …

With the development of system-on-chip (SoC) and chiplet technology in the post-Moore era,
an increasing number of chiplets are being integrated into a single chip. Consequently, the …

We present a selective encoding method that reduces test data volume and test application
time for scan testing of intellectual property (IP) cores. This method encodes the slices of test …

We present a new approach for deterministic built-in self-test (BIST) in which a
reconfigurable interconnection network (RIN) is placed between the outputs of a …

This paper describes a low-power (LP) programmable generator capable of producing
pseudorandom test patterns with desired toggling levels and enhanced fault coverage …