Selective area regrowth and doping for vertical gallium nitride power devices: Materials challenges and recent progress

H Fu, K Fu, C Yang, H Liu, KA Hatch, P Peri… - Materials Today, 2021 - Elsevier
This paper reviews materials challenges and recent progress for selective area regrowth
and doping for vertical gallium nitride (GaN) power devices. The purpose is to realize …

Quantum interference in graphene nanoconstrictions

P Gehring, H Sadeghi, S Sangtarash, CS Lau, J Liu… - Nano …, 2016 - ACS Publications
We report quantum interference effects in the electrical conductance of chemical vapor
deposited graphene nanoconstrictions fabricated using feedback controlled electroburning …

Direct imaging of p–n junction in core–shell GaN wires

P Tchoulfian, F Donatini, F Levy, A Dussaigne… - Nano …, 2014 - ACS Publications
While core–shell wire-based devices offer a promising path toward improved optoelectronic
applications, their development is hampered by the present uncertainty about essential …

Dopant Selective Photoelectrochemical Etching of SiC

S Whiteley, A Sorensen, JJ Vajo, R Sfadia… - Journal of The …, 2023 - iopscience.iop.org
Single crystalline 4H-SiC is a wide-gap semiconductor with optical properties that are
poised to enable new applications in MEMS and quantum devices. A number of key hurdles …

Picosecond carrier dynamics in InAs and GaAs revealed by ultrafast electron microscopy

C Perez, SR Ellis, FM Alcorn, EJ Smoll, EJ Fuller… - Science …, 2024 - science.org
Understanding the limits of spatiotemporal carrier dynamics, especially in III-V
semiconductors, is key to designing ultrafast and ultrasmall optoelectronic components …

A quantitative model for doping contrast in the scanning electron microscope using calculated potential distributions and Monte Carlo simulations

AKW Chee, RF Broom, CJ Humphreys… - Journal of Applied …, 2011 - pubs.aip.org
This paper describes the use of a Monte Carlo model incorporating a finite-element method
computing the electrostatic fields inside and outside a semiconductor, plus a ray-tracing …

[HTML][HTML] Dopant profiling in pin GaN structures using secondary electrons

SR Alugubelli, H Fu, K Fu, H Liu, Y Zhao… - Journal of Applied …, 2019 - pubs.aip.org
We show that secondary electrons in a scanning electron microscope can provide important
information about spatial dopant distribution in pin GaN structures, with the highest contrast …

Probing surface photovoltage effect using photoassisted secondary electron emission

Y Li, U Choudhry, J Ranasinghe… - The Journal of …, 2020 - ACS Publications
While the properties of surfaces and interfaces are crucial to modern devices, they are
commonly difficult to explore since the signal from the bulk often masks the surface …

Mapping polymer molecular order in the SEM with secondary electron hyperspectral imaging

RC Masters, N Stehling, KJ Abrams, V Kumar… - Advanced …, 2019 - Wiley Online Library
Understanding nanoscale molecular order within organic electronic materials is a crucial
factor in building better organic electronic devices. At present, techniques capable of …

Towards quantification of doping in gallium arsenide nanostructures by low‐energy scanning electron microscopy and conductive atomic force microscopy

R Guo, T Walther - Journal of Microscopy, 2024 - Wiley Online Library
We calculate a universal shift in work function of 59.4 meV per decade of dopant
concentration change that applies to all doped semiconductors and from this use Monte …