An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

Extensive research efforts are being carried out to evaluate and improve the reliability of
computing devices either through beam experiments or simulation-based fault injection …

This article evaluates the RISC-V Rocket processor embedded in a Commercial Off-The-
Shelf (COTS) SRAM-based field-programmable gate array (FPGA) under heavy-ions …

Embedded processors have been used in a diversity of applications, such as consumer
electronics, home appliances, and automation systems. Another area that embedded …

We present an in-depth analysis of transient faults effects on HPC applications in Intel Xeon
Phi processors based on radiation experiments and high-level fault injection. Besides …

This paper presents a dual-core lockstep (DCLS) implementation to protect hard-core
processors against radiation-induced soft errors. The proposed DCLS is applied to an …

In recent years, field-programmable gate array (FPGA) devices have attracted a lot of
attentions due to the increasing performance they provide thanks to technology scaling …

The space environment's hostility requires that the processors used in spacecraft be
designed using fault tolerance techniques to reduce the propagation of errors. In this …

Recent research has shown interest in adopting the RISC-V processors for high-reliability
electronics, such as aerospace applications. The openness of this architecture enables the …

TMR is a very effective technique to mitigate SEU effects in FPGAs, but it is often expensive
in terms of FPGA resource utilization and power consumption. For certain applications …