Direct observation of localized unoccupied states by synchrotron radiation two-color resonant...

Luminescence and structural properties of silicon-rich nitride by X-ray absorption spectroscopy

HL Hsiao, AB Yang, HL Hwang - Journal of Physics and Chemistry of …, 2008 - Elsevier
The luminescence and structural properties of silicon-rich nitride thin films were
comprehensively examined by X-ray absorption spectroscopy. The near-edge X-ray …
被引用次数：9 相关文章 所有 6 个版本

Capacitance-voltage spectroscopy of silicon nanodots

AYK Su, HL Hwang, MH Pilkuhn, Z Pei - Applied Physics Letters, 2005 - pubs.aip.org
Frequency-dependent capacitance-voltage spectroscopy was applied to investigate the
carrier transport dynamics in a silicon nanodots resonant tunneling device structure. Two …
被引用次数：9 相关文章 所有 4 个版本